scholarly journals Steward Program Proof of Concept Six-Month Status Report

2017 ◽  
Author(s):  
Mark Johnson ◽  
John Krienke ◽  
Kevin Morooney ◽  
Mark Scheible ◽  
David Walker ◽  
...  
Keyword(s):  
Status Report ◽  
Proof Of Concept ◽  
Program Proof

Progress in the compilation of the FK5

1978 ◽  
Vol 48 ◽  
pp. 421-432 ◽  
Author(s):  
W. Fricke ◽  
W. Gliese
Keyword(s):  
Status Report ◽  
Magnitude Range

Abstract:Presented is a status report on work on FK5 giving information on the following items: (a) the intended increase of the number of fundamental stars and their magnitude range in FK5, (b) available material for the improvement of the system, (c) methods for the determination of systematic differences, (d) the determination of equator and equinox of FK5, and (e) the elimination of the motion of the FK4 equinox.

Direct measurement of electron-diffraction-pattern intensities using an energy loss spectrometer

1989 ◽  
Vol 47 ◽  
pp. 668-669
Author(s):  
A. G. Jackson ◽  
M. Rowe
Keyword(s):  
Thermal Effects ◽  
Dynamic Range ◽  
Scattering Amplitude ◽  
Dynamical Theory ◽  
Site Symmetry ◽  
Proof Of Concept ◽  
Parallel Acquisition ◽  
Kinematic Approximation ◽  
Speed Up ◽  
Structure Calculations

Diffraction intensities from intermetallic compounds are, in the kinematic approximation, proportional to the scattering amplitude from the element doing the scattering. More detailed calculations have shown that site symmetry and occupation by various atom species also affects the intensity in a diffracted beam. [1] Hence, by measuring the intensities of beams, or their ratios, the occupancy can be estimated. Measurement of the intensity values also allows structure calculations to be made to determine the spatial distribution of the potentials doing the scattering. Thermal effects are also present as a background contribution. Inelastic effects such as loss or absorption/excitation complicate the intensity behavior, and dynamical theory is required to estimate the intensity value.The dynamic range of currents in diffracted beams can be 104or 105:1. Hence, detection of such information requires a means for collecting the intensity over a signal-to-noise range beyond that obtainable with a single film plate, which has a S/N of about 103:1. Although such a collection system is not available currently, a simple system consisting of instrumentation on an existing STEM can be used as a proof of concept which has a S/N of about 255:1, limited by the 8 bit pixel attributes used in the electronics. Use of 24 bit pixel attributes would easily allowthe desired noise range to be attained in the processing instrumentation. The S/N of the scintillator used by the photoelectron sensor is about 106 to 1, well beyond the S/N goal. The trade-off that must be made is the time for acquiring the signal, since the pattern can be obtained in seconds using film plates, compared to 10 to 20 minutes for a pattern to be acquired using the digital scan. Parallel acquisition would, of course, speed up this process immensely.

Scanning tunneling microscopy of polymers: A status report

1989 ◽  
Vol 47 ◽  
pp. 330-331
Author(s):  
P.E. Russell ◽  
I.H. Musselman
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Sample Surface ◽  
Atomic Scale ◽  
Constant Current ◽  
Scanning Tunneling ◽  
Status Report ◽  
Tunneling Microscopy ◽  
Research Issues ◽  
Wide Range

Scanning tunneling microscopy (STM) has evolved rapidly in the past few years. Major developments have occurred in instrumentation, theory, and in a wide range of applications. In this paper, an overview of the application of STM and related techniques to polymers will be given, followed by a discussion of current research issues and prospects for future developments. The application of STM to polymers can be conveniently divided into the following subject areas: atomic scale imaging of uncoated polymer structures; topographic imaging and metrology of man-made polymer structures; and modification of polymer structures. Since many polymers are poor electrical conductors and hence unsuitable for use as a tunneling electrode, the related atomic force microscopy (AFM) technique which is capable of imaging both conductors and insulators has also been applied to polymers.The STM is well known for its high resolution capabilities in the x, y and z axes (Å in x andy and sub-Å in z). In addition to high resolution capabilities, the STM technique provides true three dimensional information in the constant current mode. In this mode, the STM tip is held at a fixed tunneling current (and a fixed bias voltage) and hence a fixed height above the sample surface while scanning across the sample surface.

The teaching of forensic dentistry: a status report

1978 ◽  
Vol 42 (9) ◽  
pp. 532-536 ◽  
Author(s):  
EE Herschaft ◽  
RH Rasmussen
Keyword(s):  
Status Report ◽  
Forensic Dentistry

Status Report and Guide for the Evolution of Psychosocial Factors in Pain

2000 ◽  
Vol 45 (4) ◽  
pp. 457-458
Author(s):  
Diane M. Noyy ◽  
Marilu Price
Keyword(s):  
Psychosocial Factors ◽  
Status Report
Sign in / Sign up

Export Citation Format

Share Document