scholarly journals DEVELOPMENT OF COMPACT AND FLEXIBLE QUADRATURE HYBRID COUPLER USING COAXIAL CABLE WITH CAPACITIVE LOADING FOR 1.5T INDIGENOUS MRI SYSTEM

2020 ◽  
Vol 93 ◽  
pp. 143-151
Author(s):  
Rohit Apurva ◽  
Niraj Yadav ◽  
Tapas Bhuiya ◽  
Rajesh Harsh
Keyword(s):  
Coaxial Cable ◽  
Hybrid Coupler ◽  
Capacitive Loading

scholarly journals Design and Development of a Compact Rat-Race Coupler

2019 ◽  
Vol 8 (3) ◽  
pp. 36-42
Author(s):  
S. Ahirwar ◽  
D. Ramakrishna ◽  
V. M. Pandharipande
Keyword(s):  
Transmission Line ◽  
Physical Structure ◽  
Radiation Loss ◽  
Coaxial Cable ◽  
Design And Development ◽  
Ring Form ◽  
Rectangular Form ◽  
Hybrid Coupler

In this paper, design and development of compact Rat- Race coupler is presented. The device is designed with commercially available semi rigid coaxial cable. The semi rigid coaxial is modified for desired impedance to suit the requirement of Rat- race hybrid coupler. The physical structure of the coupler is in rectangular form instead of the conventional ring form. With this structure, all the ports are available in line on the same side. This eases the integration of the device with other modules or devices in the system. The total area occupied the coupler is reduced drastically by meandering the transmission line. The shielded transmission line provides better port isolation and less  radiation loss. Design, implementation and measured results are presented.

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

Sign in / Sign up

Export Citation Format

Share Document