No. 1 C^|^frasl;T Web Defect Inspection System, Sorting Control System Renewal

2012 ◽  
Vol 66 (3) ◽  
pp. 239-243
Author(s):  
Tohru Ohmori
Keyword(s):  
Control System ◽  
Inspection System ◽  
Defect Inspection

Methodology to Correlate Defect Reduction Systems to Electrical Test Data via Artificially Manufactured Defects

2002 ◽  
Author(s):  
Mike Santana ◽  
Alfredo V. Herrera
Keyword(s):  
Test Data ◽  
Learning Opportunities ◽  
Inspection System ◽  
Navigation Systems ◽  
Defect Inspection ◽  
Defect Reduction ◽  
Electrical Test ◽  
Important System

Abstract This paper describes a methodology for correlating physical defect inspection/navigation systems with electrical bitmap data through the fabrication of artificial defects via reticle alterations or circuit modifications using an inline FIB. The methodology chosen consisted of altering decommissioned reticles to create defects resulting in both open and shorted circuits within areas of an AMD microprocessor cache. The reticles were subsequently scanned using a KLA SL300HR StarLight inspection system to confirm their location, while wafers processed on these reticles were scanned at several layers using standard inline metrology. Finally, the wafers were electrically tested, bitmapped, and physically deprocessed. All defect data was then analyzed and cross-correlated between each system, uncovering some important system deficiencies and learning opportunities. Data and images are included to support the significance and effectiveness of such a methodology.

Study and Realization of Camera Wafer Image Fusion Algorithm

2014 ◽  
Vol 484-485 ◽  
pp. 540-546
Author(s):  
Yi Xu
Keyword(s):  
Image Fusion ◽  
Ccd Camera ◽  
Inspection System ◽  
Defect Inspection ◽  
Fusion Algorithm ◽  
Field Range ◽  
Mosaic Image

Image mosaics not only can make the collected several original images regenerate a complete image, but also can correct the error caused by imaging distortion of the original images, which can achieve the objective of rapid and correct mosaic image. The program studies the image mosaics of wafer defect inspection system. For the problem that the field range taken by CCD camera under resolution of wafer defect inspection system is small, which cant get the whole wafer image once and influences the extraction of subsequent defect features, the study demands to add image mosaics to the system.

A Robotic Defect Inspection System for Free-form Specular Surfaces

2021 ◽  
Author(s):  
Shengzeng Huo ◽  
David Navarro-Alarcon ◽  
David TW Chik
Keyword(s):  
Free Form ◽  
Inspection System ◽  
Defect Inspection ◽  
Specular Surfaces

Real-Time Image-Based Defect Inspection System of Internal Thread for Nut

2019 ◽  
Vol 68 (8) ◽  
pp. 2830-2848
Author(s):  
Chun-Fu Lin ◽  
Sheng-Fuu Lin ◽  
Chi-Hung Hwang ◽  
Hao-Kai Tu ◽  
Chih-Yen Chen ◽  
...  
Keyword(s):  
Real Time ◽  
Inspection System ◽  
Internal Thread ◽  
Defect Inspection ◽  
Real Time Image ◽  
Time Image

Defect inspection system by dot data

2009 ◽  
Author(s):  
Hiroyuki Kayaba ◽  
Hidenori Takauji ◽  
Shun'ichi Kaneko ◽  
Masataka Toda ◽  
Kouji Kuno ◽  
...  
Keyword(s):  
Inspection System ◽  
Defect Inspection

Automatic tool with adaptive suspension system for high-quality inspection of underwater risers

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Vivian Suzano Medeiros ◽  
Alan Conci Kubrusly ◽  
Raphael Lydia Bertoche ◽  
Miguel Andrade Freitas ◽  
Claudio Camerini ◽  
...  
Keyword(s):  
Control System ◽  
Oil And Gas ◽  
Pipe Wall ◽  
Mechanical Design ◽  
Experimental Tests ◽  
Gas Production ◽  
Suspension System ◽  
Inspection System ◽  
High Definition ◽  
Content Type

Purpose The inspection of flexible risers is a critical activity to ensure continuous productivity and safety in oil and gas production. The purpose of this paper is to present the design and development of a novel automatic underwater tool for riser inspection that fits the most commonly used riser diameters and significantly improves inspection quality and reduces its operating costs. Design/methodology/approach The mechanical and electronic design of the inspection system is discussed, as well as its embedded sensors and control system. The tool is equipped with a suspension system that is able to adapt to the riser diameter and negotiate obstacles on the pipe wall. Numerical simulations were carried out to analyze the mechanical design, and a hardware-in-the-loop simulation was developed for tuning the control system. Further, experimental results are presented and discussed. Findings Experimental tests in laboratory tanks and shallow seawater have confirmed the effectiveness of the tool for detailed real-time inspection of underwater pipelines. Practical implications The use of the proposed tool will potentially reduce the time and costs for riser inspection, currently performed by divers or high-cost ROVs. Originality/value The authors present a reliable tool able to perform automatic inspections up to 250 m deep in less than 30 min, equipped with a high-definition visual inspection system, composed of full-HD cameras and lasers and a suspension mechanism that can negotiate sharp obstacles in the pipe wall up to 25 mm high. The tool uses a comprehensive control system that autonomously performs a full inspection, collecting sensors data and returning safely to the surface. Its robust design can be used as basis for several other nondestructive techniques, such as ultrasound and X-ray.

Actinic EUVL mask blank defect inspection system

1999 ◽  
Author(s):  
Seongtae Jeong ◽  
Lewis E. Johnson ◽  
Yun Lin ◽  
Senajith Rekawa ◽  
Pei-yang Yan ◽  
...  
Keyword(s):  
Inspection System ◽  
Defect Inspection

EPL stencil mask defect inspection system using transmission electron beam

2003 ◽  
Author(s):  
Jiro Yamamoto ◽  
Teruo Iwasaki ◽  
Masaki Yamabe ◽  
Norimichi Anazawa ◽  
Satoru Maruyama ◽  
...  
Keyword(s):  
Electron Beam ◽  
Inspection System ◽  
Defect Inspection ◽  
Transmission Electron ◽  
Stencil Mask
Sign in / Sign up

Export Citation Format

Share Document