scholarly journals Characterization of Rock Wettability Though Dielectric Measurements

1998 ◽  
Vol 53 (6) ◽  
pp. 771-783 ◽  
Author(s):  
N. Bona ◽  
E. Rossi ◽  
C. Venturini ◽  
S. Capaccioli ◽  
M. Lucchesi ◽  
...  
Keyword(s):  
Dielectric Measurements

Strong Polarity and Bond Characterization of Nanostructured Silicon Nitride Solids

1992 ◽  
Vol 286 ◽  
Author(s):  
Lide Zhang ◽  
Chimei Mo ◽  
Tao Wang ◽  
Cunyi Xie
Keyword(s):  
Silicon Nitride ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Bond Properties ◽  
Dielectric Measurements ◽  
X Ray ◽  
Nanostructured Silicon ◽  
Spin Resonance ◽  
Measuring Frequency

ABSTRACTNanostructured silicon nitride solids (NANO–SSNS) were investigated by x–ray photoelectron spectroscopy (XPS), electron spin resonance (ESR) and dielectric measurements. It is found that the dielectric constant of NANO–SSNS depends strongly on the measuring frequency, f. When f<100Hz, at room temperature it is forty times as much as that of conventional Si3N4. ESR measurements show that a large number of unbinding electrons exist in interfaces. This suggests that the NANO–SSNS possess strong polarity. The study on the bond properties indicates that a large number of unsaturated and dangling bonds exist in interfaces of NANO–SSNS.

Characterization and dielectric properties of sodium fluoride doped talc

Clay Minerals ◽  
2014 ◽  
Vol 49 (4) ◽  
pp. 551-558
Author(s):  
S. Gümüştas ◽  
K. Köseoğlu ◽  
E. E. Yalçinkaya ◽  
M. Balcan
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Dielectric Loss ◽  
Firing Temperature ◽  
Room Temperature ◽  
Dielectric Measurements ◽  
Frequency Range ◽  
Detailed Characterization ◽  
Circuit Element

AbstractThe purpose of this paper is to determine the effect of NaF and firing temperature on the dielectric properties (dielectric constant and dielectric loss) of talc, which is used in the electrical and electronic industries as a circuit element. A detailed characterization of the samples was made by XRD, FTIR, SEM and TG-DTG methods. Dielectric measurements were performed in the frequency range from 1 MHz to 80 MHz at room temperature. The dielectric constant value increased with an increase in firing temperature due to the removal of polarizable compounds from the talc structure. The higher dielectric constant values were obtained by addition of NaF. The dielectric loss of NaF doped talc decreased with the increase of firing temperature and increased with the increase of the amount of NaF.

Unprecedented transformation of [I−·I3−] to [I42−] polyiodides in the solid state: structures, phase transitions and characterization of dipyrazolium iodide triiodide

2015 ◽  
Vol 44 (42) ◽  
pp. 18447-18458 ◽  
Author(s):  
M. Węcławik ◽  
P. Szklarz ◽  
W. Medycki ◽  
R. Janicki ◽  
A. Piecha-Bisiorek ◽  
...  
Keyword(s):  
Differential Scanning Calorimetry ◽  
Phase Transitions ◽  
Solid State ◽  
Dielectric Measurements ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Vis Spectroscopy ◽  
Solid State Structures

Dipyrazolium iodide triiodide, [C3N2H5+]2[I−·I3−], has been synthesized and studied by means of X-ray diffraction, differential scanning calorimetry, dielectric measurements, and UV-Vis spectroscopy.

Characterization of water absorbed epoxy insulating coating material used in ZnO varistors by dielectric measurements

2006 ◽  
Vol 60 (1) ◽  
pp. 114-119 ◽  
Author(s):  
Shengtao Li ◽  
Lei Liang ◽  
Jianying Li ◽  
Nian-jie Liu ◽  
Mohammad A. Alim
Keyword(s):  
Coating Material ◽  
Dielectric Measurements ◽  
Zno Varistors

scholarly journals Structural and Electric Properties of Epitaxial Na0.5Bi0.5TiO3-Based Thin Films

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 651
Author(s):  
Bruno Magalhaes ◽  
Stefan Engelhardt ◽  
Christian Molin ◽  
Sylvia E. Gebhardt ◽  
Kornelius Nielsch ◽  
...  
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Bottom Electrode ◽  
Laser Deposition ◽  
Dielectric Measurements ◽  
Columnar Microstructure ◽  
Bulk Materials ◽  
Lattice Matching ◽  
High Roughness

Substantial efforts are dedicated worldwide to use lead-free materials for environmentally friendly processes in electrocaloric cooling. Whereas investigations on bulk materials showed that Na0.5Bi0.5TiO3 (NBT)-based compounds might be suitable for such applications, our aim is to clarify the feasibility of epitaxial NBT-based thin films for more detailed investigations on the correlation between the composition, microstructure, and functional properties. Therefore, NBT-based thin films were grown by pulsed laser deposition on different single crystalline substrates using a thin epitaxial La0.5Sr0.5CoO3 layer as the bottom electrode for subsequent electric measurements. Structural characterization revealed an undisturbed epitaxial growth of NBT on lattice-matching substrates with a columnar microstructure, but high roughness and increasing grain size with larger film thickness. Dielectric measurements indicate a shift of the phase transition to lower temperatures compared to bulk samples as well as a reduced permittivity and increased losses at higher temperatures. Whereas polarization loops taken at −100 °C revealed a distinct ferroelectric behavior, room temperature data showed a significant resistive contribution in these measurements. Leakage current studies confirmed a non-negligible conductivity between the electrodes, thus preventing an indirect characterization of the electrocaloric properties of these films.

Preparation and Characterization of Polyaniline/Hexagonal Boron Nitride Composites

2013 ◽  
Vol 32 (6) ◽  
pp. 557-561 ◽  
Author(s):  
Emrah Çakmakçı ◽  
Seyfullah Madakbaş
Keyword(s):  
Boron Nitride ◽  
Hexagonal Boron Nitride ◽  
Conductive Polymer ◽  
Ftir Analysis ◽  
Dielectric Measurements ◽  
Glass Transition Temperatures ◽  
Chemical Structures ◽  
Dsc Measurements ◽  
Tga And Dsc

AbstractPolyaniline (PANI) is one of the most studied conductive polymer with several unique properties and good conductivity. In this study it was aimed to prepare Polyaniline (PANI)/Hexagonal boron nitride (h-BN) composites. Chemical structures of the composites were characterized by FTIR analysis. Thermal properties of these novel composites were analyzed by TGA and DSC measurements. Glass transition temperatures and char yields of the composites increased with increasing h-BN percentage. FTIR, XRD and UV measurements indicated that the boron atoms in h-BN particles interact with the unpaired electrons in nitrogen atoms of PANI. Dielectric measurements revealed dipolar polarization behavior of the composites.

scholarly journals NON-CONTACT DIELECTRIC MEASUREMENTS ON POLYMER FILMS

2019 ◽  
Vol 10 (1) ◽  
Author(s):  
Blanka Škipina ◽  
Adriaan S. Luyt ◽  
Duško Dudić
Keyword(s):  
Test Material ◽  
Dielectric Measurements ◽  
Dielectric Parameters ◽  
Dielectric Characterization ◽  
Polar Polymers ◽  
Flow Through ◽  
Characterization Of Materials ◽  
Simple Measuring ◽  
Stable Current

Dielectric characterization of materials in the RF domain is usually carried out on samples with applied electroconductive electrodes. A high-quality contact between a sample and the measuring electrodes provides a stable current flow through the sample and information on the exact value of the electric field in which the sample is located. It also enables a simple measuring instrument to determine the dielectric parameters of the material being tested. However, the presence of contact potentials and the exchange of charge between the test material and the applied electrodes can mask some electrical phenomena in the material or significantly affect how we perceive these phenomena. In order to detect weak electrical processes in the material, for example the photoelectric response of non-polar polymers, contactless dielectric measurements must be carried out. The literature on non-contact dielectric measurements in the RF domain is poor, and because of that, this paper presents the methodology for determining the dielectric parameters of film-shaped materials in conditions of contactless dielectric measurements.

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