INVENT Surrogate Modeling and Optimization of Transient Thermal Responses

2012 ◽  
Author(s):  
Cameron Miller ◽  
Adam Maser ◽  
Elena Garcia ◽  
Dimitri Mavris
Keyword(s):  
Surrogate Modeling ◽  
Modeling And Optimization ◽  
Transient Thermal

scholarly journals Deep learning‐based surrogate modeling and optimization for microalgal biofuel production and photobioreactor design

AIChE Journal ◽  
2018 ◽  
Vol 65 (3) ◽  
pp. 915-923 ◽  
Author(s):  
Ehecatl Antonio Rio‐Chanona ◽  
Jonathan L. Wagner ◽  
Haider Ali ◽  
Fabio Fiorelli ◽  
Dongda Zhang ◽  
...  
Keyword(s):  
Deep Learning ◽  
Surrogate Modeling ◽  
Biofuel Production ◽  
Modeling And Optimization ◽  
Photobioreactor Design

Comparison of Ion-Milling Techniques For Cross-Sectional TEM of Semiconductors

1985 ◽  
Vol 43 ◽  
pp. 166-167
Author(s):  
Julia T. Luck ◽  
C. W. Boggs ◽  
S. J. Pennycook
Keyword(s):  
Analytical Techniques ◽  
Sample Surface ◽  
Ion Milling ◽  
Cross Sectional ◽  
Reliable Technique ◽  
Near Surface ◽  
Transmission Electron ◽  
Thin Region ◽  
Transient Thermal

The use of cross-sectional Transmission Electron Microscopy (TEM) has become invaluable for the characterization of the near-surface regions of semiconductors following ion-implantation and/or transient thermal processing. A fast and reliable technique is required which produces a large thin region while preserving the original sample surface. New analytical techniques, particularly the direct imaging of dopant distributions, also require good thickness uniformity. Two methods of ion milling are commonly used, and are compared below. The older method involves milling with a single gun from each side in turn, whereas a newer method uses two guns to mill from both sides simultaneously.

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