scholarly journals Effect of a Magnetic Field in Simulating the Very Near-Field Plume of an Anode Layer Hall Thruster

2007 ◽  
Author(s):  
Yongjun Choi ◽  
Michael Keidar ◽  
Iain Boyd
Keyword(s):  
Magnetic Field ◽  
Near Field ◽  
Hall Thruster ◽  
Anode Layer

Effect of a magnetic field in simulating the plume field of an anode layer Hall thruster

2009 ◽  
Vol 105 (1) ◽  
pp. 013303 ◽  
Author(s):  
Yongjun Choi ◽  
Iain D. Boyd ◽  
Michael Keidar
Keyword(s):  
Magnetic Field ◽  
Hall Thruster ◽  
Anode Layer

Operational Properties of UT-58 Anode Layer Hall Thruster with Modified Magnetic Field and Guard-ring Material

2016 ◽  
Author(s):  
Junhwi Bak ◽  
Yushi Hamada ◽  
Yuya Hirano ◽  
Kimiya Komurasaki ◽  
Tony Schönherr ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Hall Thruster ◽  
Guard Ring ◽  
Anode Layer ◽  
Ring Material

Waveform Conversion and Validation of Transient Magnetic Field due to ESD using Equivalent Circuit of Magnetic Near-field Probe

2021 ◽  
Vol 141 (11) ◽  
pp. 606-614
Author(s):  
Jiaqing Wang ◽  
Ken Kawamata ◽  
Shinobu Ishigami ◽  
Takeshi Ishida ◽  
Osamu Fujiwara
Keyword(s):  
Magnetic Field ◽  
Equivalent Circuit ◽  
Near Field ◽  
Transient Magnetic Field

A Simple Miniature Ultrawideband Magnetic Field Probe Design for Magnetic Near-Field Measurements

2016 ◽  
Vol 64 (12) ◽  
pp. 5459-5465 ◽  
Author(s):  
Zhaowen Yan ◽  
Jianwei Wang ◽  
Wei Zhang ◽  
Yansheng Wang ◽  
Jun Fan
Keyword(s):  
Magnetic Field ◽  
Near Field ◽  
Field Measurements ◽  
Probe Design

The Study on Automobile Electronic Key Systems using Numerical Analysis

2012 ◽  
Vol 490-495 ◽  
pp. 1655-1658
Author(s):  
Xu Song Sun
Keyword(s):  
Magnetic Field ◽  
Numerical Analysis ◽  
Near Field ◽  
Automobile Electronic

Paper was removed due to verbatim plagiarism. The original paper was published as follows: Sugahara, K.; Yamamoto, H..; Ouchi, H..; Nakano, Y.., "Numerical Analysis of Near-Field Magnetic Field for Automobile Electronic Key Systems," Magnetics, IEEE Transactions on , vol.43, no.8, pp.3375,3379, Aug. 2007 http://ieeexplore.ieee.org/xpls/icp.jsp?arnumber=4277913

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