Bispectral Analysis of High-Amplitude Jet Noise

2005 ◽  
Author(s):  
Kent Gee ◽  
Anthony Atchley ◽  
Lauren Falco ◽  
Thomas Gabrielson ◽  
Victor Sparrow
Keyword(s):  
Jet Noise ◽  
High Amplitude ◽  
Bispectral Analysis

Comparison of nonlinear, geometric, and absorptive effects in high-amplitude jet noise propagation

2014 ◽  
Vol 136 (4) ◽  
pp. 2102-2102 ◽  
Author(s):  
Brent O. Reichman ◽  
Kent L. Gee ◽  
Tracianne B. Neilsen ◽  
Joseph J. Thaden ◽  
Michael M. James
Keyword(s):  
Jet Noise ◽  
High Amplitude ◽  
Noise Propagation ◽  
Nonlinear Geometric

Analysis of high‐amplitude jet noise using nonlinearity indicators

2006 ◽  
Vol 119 (5) ◽  
pp. 3384-3384
Author(s):  
Kent L. Gee ◽  
Micah R. Shepherd ◽  
Lauren E. Falco ◽  
Anthony A. Atchley ◽  
Lawrence S. Ukeiley ◽  
...  
Keyword(s):  
Jet Noise ◽  
High Amplitude

On the Perception of Crackle in High-Amplitude Jet Noise

AIAA Journal ◽  
2007 ◽  
Vol 45 (3) ◽  
pp. 593-598 ◽  
Author(s):  
Kent L. Gee ◽  
Victor W. Sparrow ◽  
Anthony Atchley ◽  
Thomas B. Gabrielson
Keyword(s):  
Jet Noise ◽  
High Amplitude

Single-point nonlinearity indicators for the propagation of high-amplitude jet noise

2008 ◽  
Author(s):  
Lauren E. Falco ◽  
Anthony A. Atchley ◽  
Bengt Enflo ◽  
Claes M. Hedberg ◽  
Leif Kari
Keyword(s):  
Single Point ◽  
Jet Noise ◽  
High Amplitude

Analysis of Leakage Failures in Flash Memory Devices and Root Cause Identification

2000 ◽  
Author(s):  
J. N. C. de Luna ◽  
M. O. del Fierro ◽  
J. L. Muñoz
Keyword(s):  
Flash Memory ◽  
Electromagnetic Interference ◽  
Yield Loss ◽  
High Amplitude ◽  
Physical Analysis ◽  
Input Buffer ◽  
Automated Test Equipment ◽  
Root Cause ◽  
Root Cause Identification ◽  
Test Process

Abstract An advanced flash bootblock device was exceeding current leakage specifications on certain pins. Physical analysis showed pinholes on the gate oxide of the n-channel transistor at the input buffer circuit of the affected pins. The fallout contributed ~1% to factory yield loss and was suspected to be caused by electrostatic discharge or ESD somewhere in the assembly and test process. Root cause investigation narrowed down the source to a charged core picker inside the automated test equipment handlers. By using an electromagnetic interference (EMI) locator, we were able to observe in real-time the high amplitude electromagnetic pulse created by this ESD event. Installing air ionizers inside the testers solved the problem.

Energy transfer mechanism of supersonic jet noise through rectangular nozzles

2017 ◽  
Vol 65 (2) ◽  
pp. 110-120 ◽  
Author(s):  
Zhe Chen ◽  
Jiu-Hui Wu ◽  
A-Dan Ren ◽  
Xin Chen ◽  
Zhen Huang
Keyword(s):  
Energy Transfer ◽  
Supersonic Jet ◽  
Jet Noise ◽  
Transfer Mechanism ◽  
Energy Transfer Mechanism ◽  
Supersonic Jet Noise
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