Some Applications of Pure Radiation Exchange Techniques in Satellite Thermal Control

Author(s):  
Jih-Run Tsai
2021 ◽  
Vol 13 (4) ◽  
pp. 59-74
Author(s):  
Ahmed ELWETEEDY ◽  
Ali ELMAIHY ◽  
Ahmed ELHEFNAWY

This paper is about the modeling and design of the passive thermal control system for the European Student Earth Orbiter (ESEO) satellite. A detailed thermal model was created in Thermal Desktop software. The model was running for the operative phase which includes cycles of 28 orbits. During these 28 orbits, there are several modes (10 modes). Each mode has a specific duration, attitude (Sun-nadir), and certain internal heat dissipation. The design of the passive thermal control system was based on controlling the conductive and radiative heat exchange between the internal components and the mounting panels, between panels themselves, and controlling external radiation exchange to achieve the desired components temperature ranges. The temperature results from simulations were presented to show the expected component temperatures and to demonstrate that the passive thermal control system met the requirements of the temperature limits. The final passive thermal control design shows that the satellite components temperatures were always maintained within their required limits during the operational phase


Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.


2007 ◽  
Vol 38 (3) ◽  
pp. 245-258 ◽  
Author(s):  
Leonid L. Vasiliev ◽  
Andrei G. Kulakov ◽  
L. L. Vasiliev, Jr ◽  
Mikhail I. Rabetskii ◽  
A. A. Antukh

Author(s):  
S. A. Hryshyn ◽  
A. G. Batischev ◽  
S. V. Koldashov ◽  
Aliaksei L. Petsiuk ◽  
V. A. Seliantev ◽  
...  

Author(s):  
Alejandro Torres ◽  
Donatas Mishkinis ◽  
Andrei Kulakov ◽  
Francisco Romera ◽  
Carmen Gregori

Sign in / Sign up

Export Citation Format

Share Document