Spectroscopic study of arc-heated nonequilibrium nitrogen flow before a blunt body

1998 ◽  
Author(s):  
Naoki Hamamoto ◽  
Yoshiaki Nakamura ◽  
Tomoyuki Suzuki
1997 ◽  
Author(s):  
Harvel Blackwell ◽  
Carl Scott ◽  
Sivaram Arepalli ◽  
Harvel Blackwell ◽  
Carl Scott ◽  
...  
Keyword(s):  

Author(s):  
Andrea Cristofolini ◽  
Carlo Borghi ◽  
Gabriele Neretti ◽  
Federico De Filippis ◽  
Fabio Roveda ◽  
...  

1997 ◽  
Vol 38 (10-13) ◽  
pp. 1177-1186
Author(s):  
N. Hamamoto ◽  
H. Kawazoe ◽  
Y. Nakamura ◽  
N. Arai ◽  
K. Kitagawa

1965 ◽  
Vol 5 ◽  
pp. 120-130
Author(s):  
T. S. Galkina

It is necessary to have quantitative estimates of the intensity of lines (both absorption and emission) to obtain the physical parameters of the atmosphere of components.Some years ago at the Crimean observatory we began the spectroscopic investigation of close binary systems of the early spectral type with components WR, Of, O, B to try and obtain more quantitative information from the study of the spectra of the components.


Author(s):  
A. De Veirman ◽  
J. Van Landuyt ◽  
K.J. Reeson ◽  
R. Gwilliam ◽  
C. Jeynes ◽  
...  

In analogy to the formation of SIMOX (Separation by IMplanted OXygen) material which is presently the most promising silicon-on-insulator technology, high-dose ion implantation of cobalt in silicon is used to synthesise buried CoSi2 layers. So far, for high-dose ion implantation of Co in Si, only formation of CoSi2 is reported. In this paper it will be shown that CoSi inclusions occur when the stoichiometric Co concentration is exceeded at the peak of the Co distribution. 350 keV Co+ ions are implanted into (001) Si wafers to doses of 2, 4 and 7×l017 per cm2. During the implantation the wafer is kept at ≈ 550°C, using beam heating. The subsequent annealing treatment was performed in a conventional nitrogen flow furnace at 1000°C for 5 to 30 minutes (FA) or in a dual graphite strip annealer where isochronal 5s anneals at temperatures between 800°C and 1200°C (RTA) were performed. The implanted samples have been studied by means of Rutherford Backscattering Spectroscopy (RBS) and cross-section Transmission Electron Microscopy (XTEM).


Agronomie ◽  
2003 ◽  
Vol 23 (8) ◽  
pp. 719-724 ◽  
Author(s):  
Giovanni Gigliotti ◽  
Alceo Macchioni ◽  
Cristiano Zuccaccia ◽  
Pier Lodovico Giusquiani ◽  
Daniela Businelli

2006 ◽  
Vol 20 ◽  
pp. 289-290
Author(s):  
I. Momcheva ◽  
K. Williams ◽  
C. Keeton ◽  
A. Zabludoff

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