B-1B/MJU-23 flare strike test program

1997 ◽  
Author(s):  
John Humphries ◽  
David Miller ◽  
John Humphries ◽  
David Miller
Keyword(s):  
Test Program

Precision and bias in quantitative EDS: ASTM results

1992 ◽  
Vol 50 (2) ◽  
pp. 1654-1655
Author(s):  
John J. Friel
Keyword(s):  
Stainless Steel ◽  
Quantitative Analysis ◽  
Mechanical Alloy ◽  
Dead Time ◽  
Test Program ◽  
Round Robin Test ◽  
Wide Range ◽  
American Society ◽  
Takeoff Angle ◽  
Standardless Analysis

Committee E-04 on Metallography of the American Society for Testing and Materials (ASTM) conducted an interlaboratory round robin test program on quantitative energy dispersive spectroscopy (EDS). The test program was designed to produce data on which to base a precision and bias statement for quantitative analysis by EDS. Nine laboratories were sent specimens of two well characterized materials, a type 308 stainless steel, and a complex mechanical alloy from Inco Alloys International, Inconel® MA 6000. The stainless steel was chosen as an example of a straightforward analysis with no special problems. The mechanical alloy was selected because elements were present in a wide range of concentrations; K, L, and M lines were involved; and Ta was severely overlapped with W. The test aimed to establish limits of precision that could be routinely achieved by capable laboratories operating under real world conditions. The participants were first allowed to use their own best procedures, but later were instructed to repeat the analysis using specified conditions: 20 kV accelerating voltage, 200s live time, ∼25% dead time and ∼40° takeoff angle. They were also asked to run a standardless analysis.

Structural Foam Sheathing Test Program

AEI 2019 ◽  
2019 ◽  
Author(s):  
S. Shadravan ◽  
C. Ramseyer
Keyword(s):  
Test Program ◽  
Structural Foam

Science Plan for the Nuclear Electric Propulsion Space Test Program (NEPSTP)

1993 ◽  
Author(s):  
B. MAUK ◽  
P. BYTHROW ◽  
N. GATSONIS ◽  
R. MCNUTT, JR.
Keyword(s):  
Electric Propulsion ◽  
Test Program

LADA Synchronization for Symmetric and Asymmetric ATE Test Program Cycles

2019 ◽  
Author(s):  
Arun Kumar Karunanithi ◽  
Joseph Caroselli ◽  
Jason Christensen ◽  
Michell Espitia
Keyword(s):  
Cycle Time ◽  
Dwell Time ◽  
Turnaround Time ◽  
Test Program ◽  
Area Of Interest ◽  
Marginal State ◽  
Structural Failures ◽  
Major Factors ◽  
High Level ◽  
Program Cycle

Abstract Laser Assisted Device Alteration (LADA) or Soft Defect Localization (SDL) is commonly used to root cause device marginality due to functional or structural failures. At a high level, LADA involves setting the device under test (DUT) at its marginal state and using focused near infra-red laser beams to perturb sensitive circuitry [1]. Scanning the focused laser beam over the die can be a long and time-consuming process. In this paper, two LADA cases are presented, which involve a parametric measurement failure while running a dynamic ATE test. Using LADA technique, these two cases were root caused. These two cases also explain how a parametric measurement-based LADA can be setup on ATE, as well as a synchronization method independent of vectors in a pattern. Synchronization was necessitated in the 2nd case due to the asymmetric test program loop, as well as the long test program cycle time. There are many factors which impact LADA turnaround time and it can take anywhere between few seconds to one day. The two major factors are the size of the Area of Interest (AOI) and test program cycle time. Test program cycle time influences the laser “dwell time” for LADA. Dwell time, in simple terms, is the total time the laser is parked at each pixel. The laser can also be synchronized with the test program cycle, keeping the two always in phase. This is explained in Case 2, where LADA synchronization was implemented, and the analysis was successfully completed in time, even though the test cycle time was very long.

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