MICROWAVE MEASUREMENTS OF ELECTROMAGNETIC PROPERTIES OF PLASMA FLOW-FIELDS

Author(s):  
A. CARSWELL ◽  
M. BACHYNSKI ◽  
G. CLOUTIER
2010 ◽  
Vol 283 (21) ◽  
pp. 4214-4218 ◽  
Author(s):  
Yun-yun Chen ◽  
Yang Song ◽  
Zhen-hua Li ◽  
An-zhi He

2013 ◽  
Vol 52 (12) ◽  
pp. 2653
Author(s):  
Yun-yun Chen ◽  
Ying-ying Zhang ◽  
Cheng-yi Zhang ◽  
Zhen-hua Li

Materials ◽  
2021 ◽  
Vol 14 (17) ◽  
pp. 5097
Author(s):  
Jerzy Krupka

A review of measurement methods of the basic electromagnetic parameters of materials at microwave frequencies is presented. Materials under study include dielectrics, semiconductors, conductors, superconductors, and ferrites. Measurement methods of the complex permittivity, the complex permeability tensor, and the complex conductivity and related parameters, such as resistivity, the sheet resistance, and the ferromagnetic linewidth are considered. For dielectrics and ferrites, the knowledge of their complex permittivity and the complex permeability at microwave frequencies is of practical interest. Microwave measurements allow contactless measurements of their resistivity, conductivity, and sheet resistance. These days contactless conductivity measurements have become more and more important, due to the progress in materials technology and the development of new materials intended for the electronic industry such as graphene, GaN, and SiC. Some of these materials, such as GaN and SiC are not measurable with the four-point probe technique, even if they are conducting. Measurement fixtures that are described in this paper include sections of transmission lines, resonance cavities, and dielectric resonators.


2020 ◽  
Vol 249 (1) ◽  
pp. 10 ◽  
Author(s):  
Z. Wang ◽  
H. S. Fu ◽  
V. Olshevsky ◽  
Y. Y. Liu ◽  
C. M. Liu ◽  
...  

Author(s):  
I-Fei Tsu ◽  
D.L. Kaiser ◽  
S.E. Babcock

A current theme in the study of the critical current density behavior of YBa2Cu3O7-δ (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to ˜ 1 Å. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries’ saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructural origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.


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