Inferring propeller inflow and radiation from near-field response. II - Empirical application

AIAA Journal ◽  
2001 ◽  
Vol 39 ◽  
pp. 1037-1046
Author(s):  
R. J. Minniti ◽  
W. K. Blake ◽  
T. J. Mueller
Keyword(s):  
Near Field ◽  
Empirical Application ◽  
Field Response

Inferring Propeller Inflow and Radiation from Near-Field Response, Part 2: Empirical Application

AIAA Journal ◽  
2001 ◽  
Vol 39 (6) ◽  
pp. 1037-1046 ◽  
Author(s):  
R. J. Minniti ◽  
W. K. Blake ◽  
T. J. Mueller
Keyword(s):  
Near Field ◽  
Empirical Application ◽  
Field Response

scholarly journals Single-shot imaging of surface molecular ionization in nanosystems

Nanophotonics ◽  
2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Fenghao Sun ◽  
Hui Li ◽  
Shanshan Song ◽  
Fei Chen ◽  
Jiawei Wang ◽  
...  
Keyword(s):  
Near Infrared ◽  
Strong Field ◽  
Imaging Technique ◽  
Near Field ◽  
Velocity Map Imaging ◽  
Single Shot ◽  
Surface Molecules ◽  
Nanoparticle Interactions ◽  
Field Response ◽  
Ion Species

Abstract Using single-shot velocity map imaging technique, explosion imaging of different ion species ejected from 50 nm SiO2 nanoparticles are obtained excitedly by strong near-infrared and ultraviolet femtosecond laser fields. Characteristic momentum distributions showing forward emission of the ions at low excitation intensities and shock wave behaviors at high intensities are observed. When the excitation intensity is close to the dissociative ionization threshold of the surface molecules, the resulting ion products can be used to image the instant near-field distributions. The underlying dynamics of shock formation are simulated by using a Coulomb explosion model. Our results allow one to distinguish the ultrafast strong-field response of various molecular species in nanosystems and will open a new way for further exploration of the underlying dynamics of laser-and-nanoparticle interactions.

The FDTD Analysis of Near-Field Response for Microgroove Structure With Standing Wave Illumination for the Realization of Coherent Structured Illumination Microscopy

2021 ◽  
Author(s):  
Yizhao Guan ◽  
Hiromasa Kume ◽  
Shotaro Kadoya ◽  
Masaki Michihata ◽  
Satoru Takahashi
Keyword(s):  
Standing Wave ◽  
Incident Angle ◽  
Near Field ◽  
Super Resolution ◽  
Structured Illumination ◽  
Field Phase ◽  
Structured Illumination Microscopy ◽  
Depth Measurement ◽  
Field Response ◽  
Depth Dependency

Abstract Microstructures are widely used in the manufacture of functional surfaces. An optical-based super-resolution, non-invasive method is preferred for the inspection of surfaces with massive microstructures. The Structured Illumination Microscopy (SIM) uses standing-wave illumination to reach optical super-resolution. Recently, coherent SIM is being studied. It can obtain not only the super-resolved intensity distribution but also the phase and amplitude distribution of the sample surface beyond the diffraction limit. By analysis of the phase-depth dependency, the depth measurement for microgroove structures with coherent SIM is expected. FDTD analysis is applied for observing the near-field response of microgroove under the standing-wave illumination. The near-field phase shows depth dependency in this analysis. Moreover, the effects from microgroove width, the incident angle, and the relative position between the standing-wave peak and center of the microgroove are investigated. It is found the near-field phase change can measure depth until 200 nm (aspect ratio 1) with an error of up to 20.4 nm in the case that the microgroove width is smaller than half of the wavelength.

THE FDTD ANALYSIS OF NEAR-FIELD RESPONSE FOR MICROGROOVE STRUCTURE WITH STANDING WAVE ILLUMINATION FOR THE REALIZATION OF COHERENT STRUCTURED ILLUMINATION MICROSCOPY

2021 ◽  
pp. 1-4
Author(s):  
Yizhao Guan ◽  
Hiromasa Kume ◽  
Shotaro Kadoya ◽  
Masaki Michihata ◽  
Satoru Takahashi
Keyword(s):  
Standing Wave ◽  
Incident Angle ◽  
Near Field ◽  
Super Resolution ◽  
Structured Illumination ◽  
Field Phase ◽  
Structured Illumination Microscopy ◽  
Depth Measurement ◽  
Field Response ◽  
Depth Dependency

Abstract Microstructures are widely used in the manufacture of functional surfaces. An optical-based super-resolution, non-invasive method is preferred for the inspection of surfaces with massive microstructures. The Structured Illumination Microscopy (SIM) uses standing-wave illumination to reach optical super-resolution. Recently, coherent SIM is being studied. It can obtain not only the super-resolved intensity distribution but also the phase and amplitude distribution of the sample surface beyond the diffraction limit. By analysis of the phase-depth dependency, the depth measurement for microgroove structures with coherent SIM is expected. FDTD analysis is applied for observing the near-field response of microgroove under the standing-wave illumination. The near-field phase shows depth dependency in this analysis. Moreover, the effects from microgroove width, the incident angle, and the relative position between the standing-wave peak and center of the microgroove are investigated. It is found the near-field phase change can measure depth until 200 nm (aspect ratio 1) with an error of up to 20.4 nm in the case that the microgroove width is smaller than half of the wavelength.

Experimental observed plasmon near-field response in isolated suspended graphene resonators

2019 ◽  
Vol 30 (50) ◽  
pp. 505201
Author(s):  
Ni Zhang ◽  
Xiaojie Jiang ◽  
Jiang Fan ◽  
Weiwei Luo ◽  
Yinxiao Xiang ◽  
...  
Keyword(s):  
Near Field ◽  
Suspended Graphene ◽  
Field Response

High-Frequency Response of an Elastic Spherical Shell

1969 ◽  
Vol 36 (4) ◽  
pp. 859-864 ◽  
Author(s):  
David Feit ◽  
M. C. Junger
Keyword(s):  
Spherical Shell ◽  
Flat Plate ◽  
Wave Field ◽  
Classical Solution ◽  
High Frequency ◽  
Natural Frequencies ◽  
Near Field ◽  
Flexural Wave ◽  
High Frequency Response ◽  
Field Response

The classical solution of the point-excited spherical shell, in the form of a normal-mode series, converges poorly for large frequencies. By applying the Watson-Sommerfeld transformation to this series, the response is expressed as a sum of only two terms. These terms can be interpreted, respectively, as the near-field response and propagating flexural wave field of an infinite flat plate, the latter term being multiplied by a factor whose maxima coincide with the natural frequencies of the shell.

Propagation oscillations in the near-field response of traveling surface waves launched by metallic nanoapertures

2008 ◽  
Vol 93 (1) ◽  
pp. 171-176 ◽  
Author(s):  
V. Anikeyev ◽  
V. V. Temnov ◽  
U. Woggon ◽  
E. Devaux ◽  
T. W. Ebbesen
Keyword(s):  
Surface Waves ◽  
Near Field ◽  
Field Response
Sign in / Sign up

Export Citation Format

Share Document