Advanced Computer Control

2014 ◽  
Keyword(s):  
Computer Control ◽  
Advanced Computer

Complete Three-Dimensional Aerodynamic CAE System and Artificial Intelligence Control System for Centrifugal Compressor

1992 ◽  
Author(s):  
Yoshiteru Fukao ◽  
Toshiaki Baba ◽  
Takeshi Inaba ◽  
Fumikata Kano
Keyword(s):  
Artificial Intelligence ◽  
Control System ◽  
Centrifugal Compressor ◽  
Computer Control ◽  
Flow Analysis ◽  
Three Dimensional ◽  
Multi Stage ◽  
Improved Performance ◽  
Cae System ◽  
Advanced Computer

Abstract An advanced computer-aided engineering (CAE) system including a complete three-dimensional flow analysis has been developed for a centrifugal compressor. It is one of the most advanced computer fluid dynamics (CFD) in the world. Flow in compressor components is calculated and evaluated in this system in terms of the three-dimensional, viscous, compressible, turbulent and rotational flow. This aerodynamic CAE system has already been applied to the actual compressor design. To improve efficiency, an automatic performance control system for a multi-stage centrifugal compressor was developed where the rotational speed and the vane setting angles were controlled by artificial intelligence (AI). Improved performance of a compressor with this computer control system was comfirmed under actual operation.

Advanced computer control of electrophysiological experimentation

1996 ◽  
Vol 65 (1) ◽  
pp. 19-26 ◽  
Author(s):  
L. Thomsen ◽  
G.T. Pearson ◽  
E. Skadhauge ◽  
E.Hviid Larsen
Keyword(s):  
Computer Control ◽  
Advanced Computer

Microdensitometer—computer correlation analysis of ultrastructural periodicity

1978 ◽  
Vol 36 (2) ◽  
pp. 32-33
Author(s):  
D.R. Ensor ◽  
C.G. Jensen ◽  
J.A. Fillery ◽  
R.J.K. Baker
Keyword(s):  
Correlation Analysis ◽  
Background Noise ◽  
Computer Control ◽  
Optical Diffraction ◽  
Screw Thread ◽  
Straight Line ◽  
Computer Storage ◽  
Correlation Process ◽  
Electron Microscope Image ◽  
Fixed Beam

Because periodicity is a major indicator of structural organisation numerous methods have been devised to demonstrate periodicity masked by background “noise” in the electron microscope image (e.g. photographic image reinforcement, Markham et al, 1964; optical diffraction techniques, Horne, 1977; McIntosh,1974). Computer correlation analysis of a densitometer tracing provides another means of minimising "noise". The correlation process uncovers periodic information by cancelling random elements. The technique is easily executed, the results are readily interpreted and the computer removes tedium, lends accuracy and assists in impartiality.A scanning densitometer was adapted to allow computer control of the scan and to give direct computer storage of the data. A photographic transparency of the image to be scanned is mounted on a stage coupled directly to an accurate screw thread driven by a stepping motor. The stage is moved so that the fixed beam of the densitometer (which is directed normal to the transparency) traces a straight line along the structure of interest in the image.

Defocus ramp correction in spot-scan imaging

1992 ◽  
Vol 50 (1) ◽  
pp. 130-131
Author(s):  
Kenneth H. Downing
Keyword(s):  
Computer Control ◽  
Three Dimensional ◽  
Sufficient Accuracy ◽  
Objective Lens ◽  
Electron Crystallography ◽  
Contrast Transfer Function ◽  
Tilt Axis ◽  
Specimen Height ◽  
The Difference ◽  
Envelope Functions

Three-dimensional structures of a number of samples have been determined by electron crystallography. The procedures used in this work include recording images of fairly large areas of a specimen at high tilt angles. There is then a large defocus ramp across the image, and parts of the image are far out of focus. In the regions where the defocus is large, the contrast transfer function (CTF) varies rapidly across the image, especially at high resolution. Not only is the CTF then difficult to determine with sufficient accuracy to correct properly, but the image contrast is reduced by envelope functions which tend toward a low value at high defocus.We have combined computer control of the electron microscope with spot-scan imaging in order to eliminate most of the defocus ramp and its effects in the images of tilted specimens. In recording the spot-scan image, the beam is scanned along rows that are parallel to the tilt axis, so that along each row of spots the focus is constant. Between scan rows, the objective lens current is changed to correct for the difference in specimen height from one scan to the next.

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