scholarly journals A Study on the Mechanism of Small Fatigue Crack Deflection Behavior in .ALPHA.-Brass by Means of In-situ Atomic Force Microscopy and Crystallographic Orientation Analysis

2005 ◽  
Vol 54 (12) ◽  
pp. 1268-1274 ◽  
Author(s):  
Atsushi SUGETA ◽  
Yoshihiko UEMATSU ◽  
Ei-ichi KURONAGA ◽  
Masahiro JONO
Keyword(s):  
Atomic Force Microscopy ◽  
Fatigue Crack ◽  
Crystallographic Orientation ◽  
Crack Deflection ◽  
Orientation Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Small Fatigue Crack ◽  
Alpha Brass

A Study on the Mechanism of Small Fatigue Crack Deflection Behavior in Alpha-Brass by Means of In Situ Atomic Force Microscopy and Crystallo-Graphic Orientation Analysis

2007 ◽  
Vol 353-358 ◽  
pp. 1225-1228 ◽  
Author(s):  
Atsushi Sugeta ◽  
Yoshihiko Uematsu ◽  
M. Jono
Keyword(s):  
Fatigue Crack ◽  
Fatigue Testing ◽  
Testing Machine ◽  
Crack Deflection ◽  
Crack Growth Behavior ◽  
Orientation Analysis ◽  
Atomic Force ◽  
Slip Factor ◽  
Small Fatigue Crack ◽  
Alpha Brass

Successive observation of transgranular small fatigue crack growth behavior of alpha-brass was performed by means of an atomic force microscope (AFM) equipped with small in-plane bending fatigue testing machine. In the low growth rate region after crack initiation, the fatigue crack grew in a zig-zag manner as a result of successive crack branching and deflection. The fatigue crack deflection behavior was investigated by the crystallographic orientation analysis based on the Electron Back Scatter Diffraction (EBSD) technique. The slip factor considering the slip system and singular stress field at the crack tip was introduced in order to evaluate the easiness of slip deformation instead of Schmid factor. The direction of crack deflection was found to be explained well by the slip factor and the geometric relative location between the preferential slip plane and crack front.

In-Situ Atomic Force Microscopy and Crystallo Graphic Orientation Analysis of Small Fatigue Crack Deflection Behavior

2007 ◽  
Vol 345-346 ◽  
pp. 227-230
Author(s):  
Atsushi Sugeta ◽  
Yoshihiko Uematsu
Keyword(s):  
Fatigue Crack ◽  
Fatigue Testing ◽  
Testing Machine ◽  
Crack Deflection ◽  
Crack Growth Behavior ◽  
Singular Stress ◽  
Orientation Analysis ◽  
Atomic Force ◽  
Slip Factor ◽  
Small Fatigue Crack

Successive observation of transgranular small fatigue crack growth behavior of alpha-brass was performed by means of an atomic force microscope (AFM) equipped with small in-plane bending fatigue testing machine. The fatigue crack deflection behavior, which was observed frequently in the low growth rate region, was investigated by the crystallographic orientation analysis based on the Electron Back Scatter Diffraction (EBSD) technique. The slip factor considering the slip system and singular stress field at the crack tip was introduced in order to evaluate the easiness of slip deformation instead of Schmid factor. The direction of crack deflection was found to be explained well by the slip factor and the geometric relative location between the preferential slip plane and crack front.

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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