scholarly journals A Constant Incidence Angle Method to Estimate the Subsurface Distribution of Residual Stress by High-Energy X-Rays from Synchrotron Radiation Source.

2002 ◽  
Vol 51 (12) ◽  
pp. 1429-1435 ◽  
Author(s):  
Etsuya YANASE ◽  
Kouji NISHIO ◽  
Yukihiro KUSUMI ◽  
Kazuo ARAI ◽  
Yoshiaki AKINIWA ◽  
...  
2018 ◽  
Vol 51 (3) ◽  
pp. 732-745 ◽  
Author(s):  
Marianna Marciszko ◽  
Andrzej Baczmański ◽  
Manuela Klaus ◽  
Christoph Genzel ◽  
Adrian Oponowicz ◽  
...  

The main focus of the presented work was the investigation of structure and residual stress gradients in the near-surface region of materials studied by X-ray diffraction. The multireflection method was used to measure depth-dependent stress variation in near-surface layers of a Ti sample (grade 2) subjected to different mechanical treatments. First, the multireflection grazing incidence diffraction method was applied on a classical diffractometer with Cu Kα radiation. The applicability of the method was then extended by using a white synchrotron beam during an energy dispersive (ED) diffraction experiment. An advantage of this method was the possibility of using not only more than one reflection but also different wavelengths of radiation. This approach was successfully applied to analysis of data obtained in the ED experiment. There was good agreement between the measurements performed using synchrotron radiation and those with Cu Kα radiation on the classical diffractometer. A great advantage of high-energy synchrotron radiation was the possibility to measure stresses as well as thea0parameter andc0/a0ratio for much larger depths in comparison with laboratory X-rays.


2005 ◽  
Vol 61 (a1) ◽  
pp. c137-c137 ◽  
Author(s):  
E. Weckert ◽  
K. Balewski ◽  
W. Brefeld ◽  
H. Franz ◽  
R. Roehlsberger

1997 ◽  
Vol 4 (4) ◽  
pp. 199-203 ◽  
Author(s):  
Y. Kunimune ◽  
Y. Yoda ◽  
K. Izumi ◽  
M. Yabashi ◽  
X.-W. Zhang ◽  
...  

2010 ◽  
Vol 652 ◽  
pp. 70-73 ◽  
Author(s):  
Andrew King ◽  
Norbert Schell ◽  
René V. Martins ◽  
Felix Beckmann ◽  
Hans Ulrich Ruhnau ◽  
...  

Grain tracking is a term used to describe experiments that investigate polycrystalline materials in terms of the crystallites or grains from which they are composed, non-destructively and in three dimensions. The new German high brilliance synchrotron radiation source, Petra III, will become available to users in 2010 [1]. The GKSS research centre will operate two beamlines, including the high energy materials science beamline (HEMS) [2]. HEMS will feature an instrument dedicated to grain tracking, able to support a range of experiments of this kind. This paper describes the design and specification of this instrument, and gives examples of the types of experiments that will be possible.


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