scholarly journals Evaluation of X-Ray Residual Stress in High-Speed Heavy Cut Surfaces Using Machining Center.

2000 ◽  
Vol 49 (9) ◽  
pp. 963-969 ◽  
Author(s):  
Yasuo INOUE ◽  
Takeshi AMEMIYA ◽  
Kenji KASHIWAYA
Keyword(s):  
Residual Stress ◽  
High Speed ◽  
X Ray ◽  
Machining Center

Simulation and Experiment on the Residual Stress in Super-High Speed Grinding

2010 ◽  
Vol 135 ◽  
pp. 238-242
Author(s):  
Yue Ming Liu ◽  
Ya Dong Gong ◽  
Wei Ding ◽  
Ting Chao Han
Keyword(s):  
Residual Stress ◽  
High Speed ◽  
Element Model ◽  
Residual Stress Distribution ◽  
X Ray Diffraction ◽  
Machined Surface ◽  
X Ray ◽  
High Speed Grinding ◽  
Simulation And Experiment ◽  
Cylindrical Workpiece

In this paper, effective finite element model have been developed to simulation the plastic deformation cutting in the process for a single particle via the software of ABAQUS, observing the residual stress distribution in the machined surface, the experiment of grinding cylindrical workpiece has been brought in the test of super-high speed grinding, researching the residual stress under the machined surface by the method of X-ray diffraction, which can explore the different stresses from different super-high speed in actual, and help to analyze the means of reducing the residual stresses in theory.

Analysis on Residual Stress in TiN Coating with Different Thicknesses

2012 ◽  
Vol 217-219 ◽  
pp. 1306-1311
Author(s):  
Chuan Liang Cao ◽  
Xiang Lin Zhang ◽  
Hai Yang Wang
Keyword(s):  
Residual Stress ◽  
High Speed ◽  
Crystal Surface ◽  
Phase Variation ◽  
High Speed Steel ◽  
X Ray Diffraction ◽  
Tin Coating ◽  
X Ray ◽  
Hardness Tester ◽  
Tin Coatings

TiN coating is often coated on fine blanking tools made of with the powder metallurgy high speed steel S790 by Multi-arc ion plating. The phase variation, residual stress and microhardness of TiN coatings were respectively analyzed by X-Ray Diffraction(XRD) and Vickers hardness tester in this research. The result shows that: there is obvious preferred orientation in the crystal surface (1 1 1) and (2 2 2) of TiN coating, the residual stress of TiN coating ranges from -2 347 MPa to -1 920 MPa, and that of the substrate from -154.9 MPa to -69.21 MPa, both of which decrease with the increasing of coating thickness. The TiN coating on the S790 substrate was annealed at temperature 500°C for one hour. It was revealed that the stress state of TiN coating was better and thus the properties of the TiN coating were improved.

Effect of Annealing on Properties of the TiN & TiAlN Coatings Deposited on Powder Metallurgy High Speed Steel ( S790 )

2013 ◽  
Vol 477-478 ◽  
pp. 1397-1402 ◽  
Author(s):  
Chuan Liang Cao ◽  
Xiang Lin Zhang ◽  
Chun Fa Dong ◽  
Xiang Zha
Keyword(s):  
Residual Stress ◽  
Powder Metallurgy ◽  
Adhesion Strength ◽  
Physical Vapor Deposition ◽  
High Speed ◽  
Phase Variation ◽  
High Speed Steel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hardness Tester

To improve the mechanical properties of the physical vapor deposition (PVD) coatings deposited on fine-blanking tools and increase the tool life, TiN and TiAlN coatings were deposited on the powder metallurgy high speed steel S790 substrates by Multi-arc ion plating, and then annealed at the temperature of 500°C for one hour in vacuum enviroment. The phase variation, residual stress, morphology, surface microhardness and adhesion strength of coatings were respectively analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), Vickers hardness tester and automatic scratch tester. The preferred orientations in the coatings are not changed after annealing, indicating no disparities in the crystal structure of the coatings. The residual stress of coatings released a little after annealing, however the adhesion strength between the coatings and substrates increased obviously, which indicated that the properties of the TiN and TiAlN coatings deposited on S790 steel were improved.

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

Growth Mechanisms of Faceted Al 3Fe Intermetallic Revealed by High-Speed Synchrotron X-Ray Quantification

2020 ◽  
Author(s):  
Zihan Song ◽  
Oxana Magdysyuk ◽  
Lei Tang ◽  
Tay Sparks ◽  
Biao Cai
Keyword(s):  
High Speed ◽  
Growth Mechanisms ◽  
X Ray

scholarly journals X-ray Determination of Compressive Residual Stresses in Spring Steel Generated by High-Speed Water Quenching

Materials ◽  
2019 ◽  
Vol 12 (7) ◽  
pp. 1154
Author(s):  
Diego E. Lozano ◽  
George E. Totten ◽  
Yaneth Bedolla-Gil ◽  
Martha Guerrero-Mata ◽  
Marcel Carpio ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Residual Stresses ◽  
High Speed ◽  
Spring Steel ◽  
X Ray Diffraction ◽  
Laboratory Equipment ◽  
X Ray ◽  
Water Chamber ◽  
Hardened Case ◽  
Compressive Residual Stresses

Automotive components manufacturers use the 5160 steel in leaf and coil springs. The industrial heat treatment process consists in austenitizing followed by the oil quenching and tempering process. Typically, compressive residual stresses are induced by shot peening on the surface of automotive springs to bestow compressive residual stresses that improve the fatigue resistance and increase the service life of the parts after heat treatment. In this work, a high-speed quenching was used to achieve compressive residual stresses on the surface of AISI/SAE 5160 steel samples by producing high thermal gradients and interrupting the cooling in order to generate a case-core microstructure. A special laboratory equipment was designed and built, which uses water as the quenching media in a high-speed water chamber. The severity of the cooling was characterized with embedded thermocouples to obtain the cooling curves at different depths from the surface. Samples were cooled for various times to produce different hardened case depths. The microstructure of specimens was observed with a scanning electron microscope (SEM). X-ray diffraction (XRD) was used to estimate the magnitude of residual stresses on the surface of the specimens. Compressive residual stresses at the surface and sub-surface of about −700 MPa were obtained.

scholarly journals Fingerprinting shock-induced deformations via diffraction

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Avanish Mishra ◽  
Cody Kunka ◽  
Marco J. Echeverria ◽  
Rémi Dingreville ◽  
Avinash M. Dongare
Keyword(s):  
High Speed ◽  
Shock Loading ◽  
Dislocation Slip ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
Final State ◽  
X Ray ◽  
Shock Testing ◽  
Local Pressures ◽  
Deformation Modes

AbstractDuring the various stages of shock loading, many transient modes of deformation can activate and deactivate to affect the final state of a material. In order to fundamentally understand and optimize a shock response, researchers seek the ability to probe these modes in real-time and measure the microstructural evolutions with nanoscale resolution. Neither post-mortem analysis on recovered samples nor continuum-based methods during shock testing meet both requirements. High-speed diffraction offers a solution, but the interpretation of diffractograms suffers numerous debates and uncertainties. By atomistically simulating the shock, X-ray diffraction, and electron diffraction of three representative BCC and FCC metallic systems, we systematically isolated the characteristic fingerprints of salient deformation modes, such as dislocation slip (stacking faults), deformation twinning, and phase transformation as observed in experimental diffractograms. This study demonstrates how to use simulated diffractograms to connect the contributions from concurrent deformation modes to the evolutions of both 1D line profiles and 2D patterns for diffractograms from single crystals. Harnessing these fingerprints alongside information on local pressures and plasticity contributions facilitate the interpretation of shock experiments with cutting-edge resolution in both space and time.

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