scholarly journals X-Ray Stress Analysis of Austenite Stainless Steel by a New Position-Sensitive Proportional Counter with Uniform Angular Resolution

1979 ◽  
Vol 28 (313) ◽  
pp. 1015-1021
Author(s):  
Yasuo YOSHIOKA ◽  
Ken-ichi HASEGAWA ◽  
Koh-ichi MOCHIKI
Keyword(s):  
Stainless Steel ◽  
Stress Analysis ◽  
Proportional Counter ◽  
Angular Resolution ◽  
X Ray ◽  
Austenite Stainless Steel ◽  
Position Sensitive

The Use of Mn-Kα X-Rays and a New Model of PSPC in Stress Analysis of Stainless Steel

1982 ◽  
Vol 26 ◽  
pp. 209-216 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Stainless Steel ◽  
Stress Analysis ◽  
High Precision ◽  
Proportional Counter ◽  
Stress Measurement ◽  
X Rays ◽  
New Model ◽  
Major Disadvantage ◽  
Position Sensitive

The authors previously reported stress measurement in stainless steel by the use of monochromatic Cr-Kβ X-rays and a position sensitive proportional counter. Results indicated that a stress value can be obtained with high precision on account of the subtraction of background and the elimination of αFe(211) peak by Cr-Kα X-rays. The major disadvantage of this method, however, is that the intensity of Kβ X-rays monochromatized is essentially weak and it is complicated to eliminate Kα X-rays for practical use.

Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter

1978 ◽  
Vol 22 ◽  
pp. 233-240 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stresses ◽  
Proportional Counter ◽  
Counting Rate ◽  
Angular Resolution ◽  
Stress Measurement ◽  
Over The Counter ◽  
X Ray ◽  
Position Sensitive ◽  
The Mean ◽  
Time Required

A position-sensitive proportional counter suitable for the X-ray stress measurement has been developed and residual stresses were measured with an apparatus that uses this PSD system. The counter was designed to have a good angular resolution over the counter length for the diffracted X-ray beam and high counting rates. The mean angular resolution measured was about 0.2° in 2θ (FWHM) at 200 mm, and the maximum allowable counting rate reached about 40,000 cps.The time required for the data accumulation was shown to be 1/10 to 1/30 of the time required with a standard diffractometer.

A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter

1984 ◽  
Vol 17 (5) ◽  
pp. 337-343 ◽  
Author(s):  
O. Yoda
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Proportional Counter ◽  
Anisotropic Scattering ◽  
Photon Flux ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

A high-resolution small-angle X-ray scattering camera has been built, which has the following features. (i) The point collimation optics employed allows the scattering cross section of the sample to be directly measured without corrections for desmearing. (ii) A small-angle resolution better than 0.5 mrad is achieved with a camera length of 1.6 m. (iii) A high photon flux of 0.9 photons μs−1 is obtained on the sample with the rotating-anode X-ray generator operated at 40 kV–30 mA. (iv) Incident X-rays are monochromated by a bent quartz crystal, which makes the determination of the incident X-ray intensity simple and unambiguous. (v) By rotation of the position-sensitive proportional counter around the direct beam, anisotropic scattering patterns can be observed without adjusting the sample. Details of the design and performance are presented with some applications.

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