scholarly journals Benoît Godin and Dominique Vinck (eds) (2017) Critical Studies of Innovation: Alternative Approaches to the Pro-Innovation Bias. Cheltenham, UK: Edward Elgar Publishing. 335 pages. ISBN: 978-1- 78536- 696- 3

2018 ◽  
pp. 59-61
Author(s):  
Barbara Bok
Keyword(s):  
Critical Studies ◽  
Alternative Approaches ◽  
Edward Elgar

Alternative approaches to ultra-high resolution imaging

1991 ◽  
Vol 49 ◽  
pp. 650-651
Author(s):  
J.M. Cowley
Keyword(s):  
High Resolution ◽  
High Voltage ◽  
High Resolution Electron Microscopy ◽  
Crystal Defects ◽  
High Resolution Imaging ◽  
General Applicability ◽  
Resolution Electron ◽  
Radiation Resistant ◽  
Resolution Imaging ◽  
Alternative Approaches

By extrapolation of past experience, it would seem that the future of ultra-high resolution electron microscopy rests with the advances of electron optical engineering that are improving the instrumental stability of high voltage microscopes to achieve the theoretical resolutions of 1Å or better at 1MeV or higher energies. While these high voltage instruments will undoubtedly produce valuable results on chosen specimens, their general applicability has been questioned on the basis of the excessive radiation damage effects which may significantly modify the detailed structures of crystal defects within even the most radiation resistant materials in a period of a few seconds. Other considerations such as those of cost and convenience of use add to the inducement to consider seriously the possibilities for alternative approaches to the achievement of comparable resolutions.

Edward Elgar, Modernist

2006 ◽  
Author(s):  
J. P. E. Harper-Scott
Keyword(s):  
Edward Elgar
Sign in / Sign up

Export Citation Format

Share Document