Measurements of Interface Conductivity of Copper-Clad Dielectric Substrates at Millimeter Wave Frequencies Using TE02δ Mode Dielectric Rod Resonator Excited by NRD Guide
2009 ◽
Vol E92-C
(9)
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pp. 1106-1110
Keyword(s):
2002 ◽
Vol 50
(1)
◽
pp. 165-171
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2006 ◽
Vol 26
(10-11)
◽
pp. 1853-1856
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