Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy

2017 ◽  
Author(s):  
F. Xia ◽  
I. Soltani Bozchalooi ◽  
K. Youcef-Toumi
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Detection ◽  
Interaction Forces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽  
1999 ◽  
Vol 15 (25) ◽  
pp. 8569-8573 ◽  
Author(s):  
William E. Farneth ◽  
R. Scott McLean ◽  
John D. Bolt ◽  
Eleni Dokou ◽  
Mark A. Barteau
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Mapping of electrical double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy

1997 ◽  
Vol 71 (18) ◽  
pp. 2632-2634 ◽  
Author(s):  
Tatsuya Miyatani ◽  
Miki Horii ◽  
Armin Rosa ◽  
Masamichi Fujihira ◽  
Othmar Marti
Keyword(s):  
Atomic Force Microscopy ◽  
Double Layer ◽  
Electrical Double Layer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Mode ◽  
Mode Atomic Force Microscopy
Sign in / Sign up

Export Citation Format

Share Document