Numerical study of the effect of diode laser-induced optical, thermal, and residual stresses on CZTS thin-films

2019 ◽  
Vol 31 (3) ◽  
pp. 032006
Author(s):  
Mohammad Shakil Ahmmed ◽  
Nazmul Huda
Keyword(s):  
Thin Films ◽  
Residual Stresses ◽  
Diode Laser ◽  
Numerical Study ◽  
Czts Thin Films

scholarly journals Effect of Prefabricated Layer Structure on Properties of CZTS Thin Films and Solar Cells

2020 ◽  
Vol 571 ◽  
pp. 012033
Author(s):  
Wenbin Hao ◽  
Jinze Li ◽  
Wei Li ◽  
Jiansheng Zhao ◽  
Jianfeng Chen
Keyword(s):  
Thin Films ◽  
Solar Cells ◽  
Layer Structure ◽  
Czts Thin Films

Fem Simulation of Micro-Rotating-Structures and Their Applications in Measurement of Residual Stresses in Thin Films

1997 ◽  
Vol 505 ◽  
Author(s):  
Xin Zhang ◽  
Tong-Yi Zhang ◽  
Yitshak Zohar
Keyword(s):  
Thin Films ◽  
Residual Stresses ◽  
Fem Simulation ◽  
Sensitivity Factor ◽  
Local Measurement ◽  
Micro Structure ◽  
Micro Raman Spectroscopy ◽  
Before And After ◽  
Polysilicon Films ◽  
Simulation Results

ABSTRACTFEM simulation of micro-rotating-structures was performed for local measurement of residual stresses in thin films. A sensitivity factor is introduced, studied and tabulated from the simulation results. The residual stress can be evaluated from the rotating deflection, the lengths of rotating and fixed beams, and the sensitivity factor. The micro-structure technique was applied to measure residual stresses in both silicon nitride and polysilicon thin films, before and after rapid thermal annealing (RTA), and further confirmed by wafer curvature method. Residual stresses in polysilicon films at different RTA stages were also characterized by micro-Raman spectroscopy (MRS). The experimental results indicate that micro-rotating-structures indeed have the ability to measure spatially and locally residual stresses in MEMS thin films with appropriate sensitivities.

Influences of alkali incorporation and electrodeposited metal layer on formation of MoS2 in CZTS thin films

2021 ◽  
Vol 134 ◽  
pp. 105943
Author(s):  
Jiao Wang ◽  
Yanping Wang ◽  
Haoran Li ◽  
Aimei Zhao ◽  
Bing Li ◽  
...  
Keyword(s):  
Thin Films ◽  
Metal Layer ◽  
Electrodeposited Metal ◽  
Czts Thin Films

The choice of Zn or ZnS layer in the stacked precursors for preparation of Cu2ZnSnS4 (CZTS) thin films

2020 ◽  
Vol 146 ◽  
pp. 106669 ◽  
Author(s):  
M.A. Olgar ◽  
A. Seyhan ◽  
A.O. Sarp ◽  
R. Zan
Keyword(s):  
Thin Films ◽  
Czts Thin Films

A Novel Ethanol-Based Non-Particulate Ink for Spin-Coating Cu2ZnSnS4 Thin Film

2021 ◽  
Vol 16 (2) ◽  
pp. 136-141
Author(s):  
Jingyuan Zhang ◽  
Yusheng Liu ◽  
Jianing Song ◽  
Mu Zhang ◽  
Xiaodong Li
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electrical Properties ◽  
Spin Coating ◽  
Treatment Temperature ◽  
Coated Film ◽  
Coating Method ◽  
Pre Treatment ◽  
Cu2znsns4 Thin Film ◽  
Czts Thin Films

The Cu2ZnSnS4 (CZTS) thin films were fabricated by the direct solution coating method using a novel non-particulate ink. The ink was formulated using ethanol as the solvent and 1,2-diaminopropane as the complex-ing agent. The pure phase kesterite films with good crystallinity, large-sized crystals and excellent electrical properties were prepared by the spin-coating deposition technique using the homogeneous and air-stable ink. It was found that the subsequent pre-treatment temperature had an influence on the film crystallinity and electrical properties. The best film was obtained by pre-treating the spin-coated film at 250 °C, and then post-annealing at 560 °C. The film shows a narrow bandgap of 1.52 eV and excellent electrical properties, with a resistivity of 0.07 Ocm, carrier concentration of 3.0 x 1017 cm-3, and mobility of 4.15 cm2 V-1 s-1. The novel non-particulate ink is promising for printing high quality CZTS thin films as absorber layers of thin film solar cells.

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