scholarly journals Chemical Structures of Adhesion Interlayer between Brass Plating and Rubber from the Viewpoint of Analysis Techniques

2015 ◽  
Vol 88 (6) ◽  
pp. 210-215 ◽  
Author(s):  
Hiromi YOSHIKAWA
Keyword(s):  
Analysis Techniques ◽  
Chemical Structures ◽  
Brass Plating

Syntheses and Characterization of Chiral Branched-Arm Liquid Crystals-Basing on Isosorbide as Chiral Core

2013 ◽  
Vol 750-752 ◽  
pp. 1203-1206 ◽  
Author(s):  
Xiao Zhi He ◽  
Li Jiao Zhang ◽  
Guang Yu Li ◽  
Mei Tian ◽  
Ying Gang Jia
Keyword(s):  
Liquid Crystals ◽  
Liquid Crystalline ◽  
Wide Angle ◽  
Cholesteric Phase ◽  
Analysis Techniques ◽  
Chemical Structures ◽  
Clearing Point ◽  
Liquid Crystalline Compound ◽  
Thermal Analysis Techniques

A new series of two-arm (MB1, MB2), four-arm (MB3), six-arm (MB4) chiral liquid crystalline compound containing isosorbide as chiral core were first synthesized. Four precursors of branched-arm B1~B4 were obtained at first and then were esterized separately with isosorbide and got four chiral branched-arm liquid crystals (MB1~MB4). The chemical structures and LC properties of the liquid crystalline molecule were measured by spectrum and thermal analysis techniques. XRD curves of MB1~MB4 samples only showed broad peaks at wide-angle, but no sharp peak was seen for all the samples. The results showed that MB1~MB4 appeared cholesteric phase with oily streak texture or lined texture and finger print texture. Isosorbide successfully induced cholesteric phase. The values of melting point and clearing point for MB1~MB4 decreased. The quantity of branched-arm and chiral core had effects on their liquid crystalline properties.

An example of spectrum imaging used for comparison of EELS quantitative analysis techniques on Al-Li

1991 ◽  
Vol 49 ◽  
pp. 726-727
Author(s):  
John A. Hunt
Keyword(s):  
Quantitative Analysis ◽  
Large Data ◽  
Difference Spectrum ◽  
Large Data Sets ◽  
Foil Thickness ◽  
Data Sets ◽  
Analysis Techniques ◽  
Spectrum Imaging ◽  
Normal Spectrum ◽  
Electron Energy Loss

Spectrum-imaging is a useful technique for comparing different processing methods on very large data sets which are identical for each method. This paper is concerned with comparing methods of electron energy-loss spectroscopy (EELS) quantitative analysis on the Al-Li system. The spectrum-image analyzed here was obtained from an Al-10at%Li foil aged to produce δ' precipitates that can span the foil thickness. Two 1024 channel EELS spectra offset in energy by 1 eV were recorded and stored at each pixel in the 80x80 spectrum-image (25 Mbytes). An energy range of 39-89eV (20 channels/eV) are represented. During processing the spectra are either subtracted to create an artifact corrected difference spectrum, or the energy offset is numerically removed and the spectra are added to create a normal spectrum. The spectrum-images are processed into 2D floating-point images using methods and software described in [1].

Dissociated Σ=27 boundaries in silicon

1988 ◽  
Vol 46 ◽  
pp. 624-625
Author(s):  
A. Garg ◽  
W.A.T. Clark ◽  
J.P. Hirth
Keyword(s):  
Electron Diffraction ◽  
Local Minimum ◽  
Boundary Energy ◽  
Coincidence Site Lattice ◽  
Boundary Plane ◽  
Low Energy ◽  
Theoretical Understanding ◽  
Site Lattice ◽  
Kikuchi Pattern ◽  
Analysis Techniques

In the last twenty years, a significant amount of work has been done in the theoretical understanding of grain boundaries. The various proposed grain boundary models suggest the existence of coincidence site lattice (CSL) boundaries at specific misorientations where a periodic structure representing a local minimum of energy exists between the two crystals. In general, the boundary energy depends not only upon the density of CSL sites but also upon the boundary plane, so that different facets of the same boundary have different energy. Here we describe TEM observations of the dissociation of a Σ=27 boundary in silicon in order to reduce its surface energy and attain a low energy configuration.The boundary was identified as near CSL Σ=27 {255} having a misorientation of (38.7±0.2)°/[011] by standard Kikuchi pattern, electron diffraction and trace analysis techniques. Although the boundary appeared planar, in the TEM it was found to be dissociated in some regions into a Σ=3 {111} and a Σ=9 {122} boundary, as shown in Fig. 1.

Material analysis techniques using the ion mill

1996 ◽  
Vol 54 ◽  
pp. 1034-1035
Author(s):  
J. P. Benedict ◽  
R. M. Anderson ◽  
S. J. Klepeis
Keyword(s):  
Polished Surface ◽  
Surface Material ◽  
Analysis Techniques ◽  
Material Analysis ◽  
Optical Inspection ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis ◽  
Argon Ions ◽  
The Impact ◽  
Scanning Electron

Ion mills equipped with flood guns can perform two important functions in material analysis; they can either remove material or deposit material. The ion mill holder shown in Fig. 1 is used to remove material from the polished surface of a sample for further optical inspection or SEM ( Scanning Electron Microscopy ) analysis. The sample is attached to a pohshing stud type SEM mount and placed in the ion mill holder with the polished surface of the sample pointing straight up, as shown in Fig 2. As the holder is rotating in the ion mill, Argon ions from the flood gun are directed down at the top of the sample. The impact of Argon ions against the surface of the sample causes some of the surface material to leave the sample at a material dependent, nonuniform rate. As a result, the polished surface will begin to develop topography during milling as fast sputtering materials leave behind depressions in the polished surface.

Chemical structure of diamond-like carbon thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 710-711
Author(s):  
N.-H. Cho ◽  
K.M. Krishnan ◽  
D.B. Bogy
Keyword(s):  
Electrical Resistivity ◽  
Chemical Structure ◽  
Diamond Like Carbon ◽  
Chemical Structures ◽  
Sputtering Power ◽  
Data Aquisition ◽  
Equilibrium Phases ◽  
Electron Energy Loss ◽  
Power Densities ◽  
Preparation Techniques

Diamond-like carbon (DLC) films have attracted much attention due to their useful properties and applications. These properties are quite variable depending on film preparation techniques and conditions, DLC is a metastable state formed from highly non-equilibrium phases during the condensation of ionized particles. The nature of the films is therefore strongly dependent on their particular chemical structures. In this study, electron energy loss spectroscopy (EELS) was used to investigate how the chemical bonding configurations of DLC films vary as a function of sputtering power densities. The electrical resistivity of the films was determined, and related to their chemical structure.DLC films with a thickness of about 300Å were prepared at 0.1, 1.1, 2.1, and 10.0 watts/cm2, respectively, on NaCl substrates by d.c. magnetron sputtering. EEL spectra were obtained from diamond, graphite, and the films using a JEOL 200 CX electron microscope operating at 200 kV. A Gatan parallel EEL spectrometer and a Kevex data aquisition system were used to analyze the energy distribution of transmitted electrons. The electrical resistivity of the films was measured by the four point probe method.

Developmental Sentence Scoring

1984 ◽  
Vol 15 (3) ◽  
pp. 154-168 ◽  
Author(s):  
Mary Ann Lively
Keyword(s):  
Expressive Language ◽  
Analysis Techniques ◽  
Language Analysis ◽  
Scoring Errors

Developmental Sentence Scoring (DSS) is a useful procedure for quantifying thegrammatic structure of children's expressive language. Like most language analysis techniques, however, DSS requires considerable study and practice to use it correctly and efficiently. Clinicians learning DSS tend to make many scoring errors at first and they display similar confusions and mistakes. This article identifies some of these common "problem" areas and provides scoring examples to assist clinicians in learning the DSS procedure.

Creative job analysis techniques of astronaut using archival data

2010 ◽  
Author(s):  
Kathryn Keeton ◽  
Holly Patterson ◽  
Lacey L. Schmidt ◽  
Kelley J. Slack ◽  
Camille Shea
Keyword(s):  
Job Analysis ◽  
Archival Data ◽  
Analysis Techniques

PENGARUH PERBAIKAN BERKESINAMBUNGAN TERHADAP KINERJA KARYAWAN (STUDI KASUS DI PT.RENTANG BUANA NIAGAMAKMUR TASIKMALAYA)

2019 ◽  
Vol 3 (1) ◽  
pp. 31-41
Author(s):  
Sri Sudiarti
Keyword(s):  
Data Analysis ◽  
Continuous Improvement ◽  
Research Method ◽  
Employee Performance ◽  
Sampling Technique ◽  
Positive Influence ◽  
Performance Criteria ◽  
Coefficient Of Determination ◽  
Analysis Techniques ◽  
Simple Regression

The objectives of this research are to know and to analyze about the effect of Continuous Improvement on the performance of employees at PT. Rentang Buana Niagamakmur (PT.RBN) Tasikmalaya. Research method which applied in this research is survey research method, while data collecting technique is done by through questionaire. Sampling technique applies sample is accidental sampling technique and the size sample is 55 respondents. Data analysis techniques used in the study is simple regression technique, analysis of the coefficient of determination  and t test. The results showed that the Continuous Improvement  including both criteria, including employee performance criteria, as well as Continuous Improvement  has a positive influence on employee performance of 76,4% in PT . Rentang Buana Niagamakmur (PT.RBN) Tasikmalaya.

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