Radiation Chemistry of High-Energy Carbon, Neon, and Argon Ions: Molecular Hydrogen Yields

1989 ◽  
Vol 118 (3) ◽  
pp. 401 ◽  
Author(s):  
A. Appleby ◽  
E. A. Christman ◽  
M. Jayko
1986 ◽  
Vol 106 (3) ◽  
pp. 300 ◽  
Author(s):  
A. Appleby ◽  
E. A. Christman ◽  
M. Jayko

1985 ◽  
Vol 104 (3) ◽  
pp. 263 ◽  
Author(s):  
A. Appleby ◽  
E. A. Christman ◽  
M. Jayko

1991 ◽  
Vol 43 (7) ◽  
pp. 3548-3552 ◽  
Author(s):  
Yuheng Zhang ◽  
Andrew W. Ross ◽  
Manfred Fink

2006 ◽  
Vol 60 (11-12) ◽  
pp. 311-315 ◽  
Author(s):  
Zorica Kacarevic-Popovic ◽  
Bojana Secerov ◽  
Milena Marinovic-Cincovic ◽  
Zoran Nedic ◽  
Slobodan Jovanovic

The possibility of modifying polyethylene and many other polymers with high energy radiation has led to many useful applications. Due to their new combination of properties and the shortage of experimental data, the radiolysis of a new class of materials, cyclo-olefin copolymers (COC), polymerised from norbornene and ethylene using metallocene catalysts, is of great interest to the study of radiation chemistry and the physics of polymeric systems. Ethylenenorbornene copolymer, pristine and containing an antioxidant were subjected to gamma irradiation in the presence of air and in water. The irradiated copolymer was studied using IR and UV-vis spectrophotometric analysis. The radiation-induced changes in the molecular structure were correlated to changes in the glass transition temperature measured by the DSC method.


2005 ◽  
Vol 864 ◽  
Author(s):  
Bentao Cui ◽  
P. I. Cohen ◽  
A. M. Dabiran

AbatractThe formation of ion induced nanoscale patterns such as ripple, dots or pores can be described by a linear continuum equation consisting of a surface roughening term due to curvature-dependent sputtering or asymmetric attachment of vacancies, and a surface smoothing term due to thermal or ion-induced diffusion. By studying ion-induced dimple volume change using atomic force microscopy, we show a method to measure the ion-roughening coefficient. Using this method, we found the roughening coefficient í was 45 nm2/sec at 730K for initial ion etchings with 300 eV Argon ions. Cathodoluminescence measurements indicated Ga-vacancy formation during ion bombardment. The activation energy for surface relaxation after ion etching was about 0.12 eV as measured by reflection high energy electron diffraction.


2018 ◽  
pp. 110-121
Author(s):  
Arturo Solís Herrera ◽  
Arias Esparza, María del Carmen ◽  
Solís Arias Ruth I ◽  
Solís Arias Paola E ◽  
Solís Arias Martha P

Sign in / Sign up

Export Citation Format

Share Document