scholarly journals Characterization of Soft Error Rate Against Memory Elements Spacing and Clock Skew in a Logic with Triple Modular Redundancy in a 65nm Process

2019 ◽  
Author(s):  
Sandeep Miryala ◽  
Tomasz Hemperek ◽  
Mohsine Menouni
Keyword(s):  
Error Rate ◽  
Soft Error ◽  
Clock Skew ◽  
Soft Error Rate ◽  
Triple Modular Redundancy ◽  
Modular Redundancy

Cosmic-ray soft error rate characterization of a standard 0.6-/spl mu/m CMOS process

2000 ◽  
Vol 35 (10) ◽  
pp. 1422-1429 ◽  
Author(s):  
P. Hazucha ◽  
C. Svensson ◽  
S.A. Wender
Keyword(s):  
Error Rate ◽  
Cosmic Ray ◽  
Soft Error ◽  
Cmos Process ◽  
Soft Error Rate

Process Variability Effect on Soft Error Rate by Characterization of Large Number of Samples

2012 ◽  
Vol 59 (6) ◽  
pp. 2914-2919 ◽  
Author(s):  
G. Gasiot ◽  
A. Castelnovo ◽  
M. Glorieux ◽  
F. Abouzeid ◽  
S. Clerc ◽  
...  
Keyword(s):  
Error Rate ◽  
Soft Error ◽  
Process Variability ◽  
Soft Error Rate

Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET

2021 ◽  
Author(s):  
B. Narasimham ◽  
V. Chaudhary ◽  
M. Smith ◽  
L. Tsau ◽  
D. Ball ◽  
...  
Keyword(s):  
Error Rate ◽  
Soft Error ◽  
Soft Error Rate
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