Measurement of the charge exchange $np\rightarrow pn$ reaction by means of the deuteron beam

Status of the SPI for the JINR Accelerator Complex

International Journal of Modern Physics Conference Series ◽

10.1142/s2010194516601034 ◽

2016 ◽

Vol 40 ◽

pp. 1660103

Author(s):

V. V. Fimushkin ◽

A. D. Kovalenko ◽

L. V. Kutuzova ◽

Yu. V. Prokofichev ◽

A. S. Belov ◽

...

Keyword(s):

Charge Exchange ◽

Deuteron Beam ◽

Ion Source ◽

Accelerator Complex ◽

Accelerator Facility ◽

Current Output ◽

Close Cooperation ◽

Under Construction ◽

Nuclotron Accelerator ◽

Tensor Formula

The Source of Polarized Ions (SPI) of deuterons and protons with nearly resonant charge-exchange plasma ionizer is under construction at the LHEP, JINR. The [Formula: see text]D[Formula: see text] ([Formula: see text]H[Formula: see text]) current output of the source is expected to be at a level of 10[Formula: see text]mA. The polarization will be up to 90% of the maximal vector (±1) for [Formula: see text]D[Formula: see text] ([Formula: see text]H[Formula: see text]) and tensor ([Formula: see text]1, [Formula: see text]) polarization for [Formula: see text]D[Formula: see text]. Realization of the project is carried out in close cooperation with INR of the RAS (Moscow). The equipment available from the CIPIOS ion source (IUCF, Bloomington, USA) is partially used for the Dubna setup. The new source at the JINR NUCLOTRON accelerator facility will make it possible to increase the polarized deuteron beam intensity up to the level of 10[Formula: see text] [Formula: see text]/pulse.

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First H+ Charge-Exchange Images in the Stim.

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092487 ◽

1976 ◽

Vol 34 ◽

pp. 504-505

Author(s):

Wm. H. Escovitz ◽

T. R. Fox ◽

R. Levi-Setti

Keyword(s):

Charge Exchange ◽

Neutral Component ◽

Channel Electron Multiplier ◽

Electron Multiplier ◽

Neutral Particles ◽

Charged Beam ◽

Scanning Transmission ◽

Contrast Mechanism ◽

Ion Microscopy ◽

Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

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