Systematic investigation of non-conformance root cause in prefabrication: a nuclear case study

2021 ◽  
Author(s):  
Steven Chuo ◽  
Qian Chen ◽  
Mohammad Mahdi Sharif ◽  
Carl T. Haas ◽  
Bryan T. Adey
Keyword(s):  
Systematic Investigation ◽  
Root Cause

Case Study of ESD-induced Pin Leakage Failure Solved Using Novel Powered TIVA Technique

2018 ◽  
Author(s):  
Sneta Mishra ◽  
Daniel R. Bockelman
Keyword(s):  
Root Cause ◽  
Leakage Failure

Abstract A case study is presented of a core CPU product where FA/FI debug is performed for an ESD-related pin leakage issue on an IO family to root cause and qualify the product. A Powered TIVA technique is used to localize the damage to the termination resistor circuitry of the affected IO block when the pin is tristated using a device tester. Failure characterization shows a gate to drain short on the transistor, with nanoprobing confirming a solid short on gate to drain and TEM finding a short at the location indicated by the TIVA hits.

Temperature and Humidity Dependent Reliability Analysis of RGB LED Chips

2006 ◽  
Author(s):  
Jun-Xian Fu ◽  
Shukri Souri ◽  
James S. Harris
Keyword(s):  
Reliability Analysis ◽  
Printed Circuit Board ◽  
Light Emitting Diode ◽  
Circuit Board ◽  
Light Emitting ◽  
Printed Circuit ◽  
Root Cause ◽  
Micro Cracks ◽  
Temperature And Humidity

Abstract Temperature and humidity dependent reliability analysis was performed based on a case study involving an indicator printed-circuit board with surface-mounted multiple-die red, green and blue light-emitting diode chips. Reported intermittent failures were investigated and the root cause was attributed to a non-optimized reflow process that resulted in micro-cracks and delaminations within the molding resin of the chips.

Case Study and Fault Modeling for Wrong Redundancy Evaluation on DRAM Devices

2007 ◽  
Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel
Keyword(s):  
Failure Mode ◽  
Failure Modes ◽  
Fault Modeling ◽  
Mode Analysis ◽  
Root Cause ◽  
Failure Mode Analysis

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.

Case Study—Failure Analysis of a Multiplexer

2016 ◽  
Author(s):  
Michael Woo ◽  
Marcos Campos ◽  
Luigi Aranda
Keyword(s):  
Failure Analysis ◽  
High Reliability ◽  
Component Failure ◽  
Root Cause ◽  
Knowing That ◽  
Cause Of Failure ◽  
The Cost

Abstract A component failure has the potential to significantly impact the cost, manufacturing schedule, and/or the perceived reliability of a system, especially if the root cause of the failure is not known. A failure analysis is often key to mitigating the effects of a componentlevel failure to a customer or a system; minimizing schedule slips, minimizing related accrued costs to the customer, and allowing for the completion of the system with confidence that the reliability of the product had not been compromised. This case study will show how a detailed and systemic failure analysis was able to determine the exact cause of failure of a multiplexer in a high-reliability system, which allowed the manufacturer to confidently proceed with production knowing that the failure was not a systemic issue, but rather that it was a random “one time” event.

Root Cause Analysis for Pin Leakage

2016 ◽  
Author(s):  
Zhigang Song ◽  
Jochonia Nxumalo ◽  
Manuel Villalobos ◽  
Sweta Pendyala
Keyword(s):  
Failure Analysis ◽  
Root Cause Analysis ◽  
Advanced Technology ◽  
Process Step ◽  
Cause Analysis ◽  
Hard Mask ◽  
Technology Node ◽  
Root Cause ◽  
Tools And Techniques

Abstract Pin leakage continues to be on the list of top yield detractors for microelectronics devices. It is simply manifested as elevated current with one pin or several pins during pin continuity test. Although many techniques are capable to globally localize the fault of pin leakage, root cause analysis and identification for it are still very challenging with today’s advanced failure analysis tools and techniques. It is because pin leakage can be caused by any type of defect, at any layer in the device and at any process step. This paper presents a case study to demonstrate how to combine multiple techniques to accurately identify the root cause of a pin leakage issue for a device manufactured using advanced technology node. The root cause was identified as under-etch issue during P+ implantation hard mask opening for ESD protection diode, causing P+ implantation missing, which was responsible for the nearly ohmic type pin leakage.

scholarly journals Investigation into the Cause of Iron-Related Clogging of Groundwater Bores Used for Viticulture in the Limestone Coast, South Australia

Water ◽  
2021 ◽  
Vol 13 (5) ◽  
pp. 683
Author(s):  
Birte Moser ◽  
Meruyert Beknazarova ◽  
Harriet Whiley ◽  
Thilini Piushani Keerthirathne ◽  
Nikki Harrington ◽  
...  
Keyword(s):  
Groundwater Resources ◽  
South Australia ◽  
Water Levels ◽  
Clear Correlation ◽  
Problem Analysis ◽  
Persistent Problem ◽  
Root Cause ◽  
Complex Interactions ◽  
Iron Manganese

Iron-related clogging of boreholes, pumps and dripper lines is a significant and costly problem for irrigators worldwide. The primary cause of iron-related clogging is still debated. Previous studies have described complex interactions between biological clogging and inorganic iron/manganese oxide precipitation. This case study examined groundwater bores used for viticulture irrigation in the Limestone Coast region, a highly productive wine growing area in the SE of South Australia. Iron clogging of bore screens, pumps and dripper systems has been a persistent problem in the region and the issue is perceived to be growing, with irrigators suggesting the widespread introduction of iron-related bacteria (IRB) through drilling equipment to be the root cause of the problem. Analysis of the groundwater microbiology and inorganic chemistry found no apparent correlation between the presence of IRB and the clogging status of wells. In fact, IRB proved to be widespread throughout the limestone aquifer. However, a clear correlation could be found between clogging affected bores and the redox potential of the groundwater with the most severely affected bores strongly oversaturated in respect to iron oxide minerals. Elevated dissolved concentrations of Fe(II) thereby tended to be found in deeper bores, which also were generally more recently drilled. Following decades of less than average rainfall, a tendency to deepen bores in response to widespread declines in water levels has been documented for the SE of South Australia. The gradually widening clogging problem in the region is postulated to be related to the changes in climate in the region, with irrigators increasingly driven to rely on deeper, anoxic iron-rich groundwater resources.

Root cause analysis of primary reformer catastrophic failure: A case study

2010 ◽  
Vol 30 (1) ◽  
pp. 62-65
Author(s):  
Naveed Ramzan ◽  
Shahid Naveed ◽  
Muhammad Rizwan ◽  
Werner Witt
Keyword(s):  
Root Cause Analysis ◽  
Catastrophic Failure ◽  
Cause Analysis ◽  
Root Cause

Troubleshooting Cable Deployed Thru Tubing Electrical Submersible Pumps: A Case Study from South East Asia

2021 ◽  
Author(s):  
Saurabh Anand ◽  
Eadie Azahar B Rosland ◽  
Elsayed Ouda Ghonim ◽  
Latief Riyanto ◽  
Khairul Azhar B Abu Bakar ◽  
...  
Keyword(s):  
Low Cost ◽  
Power Cable ◽  
Related Data ◽  
Root Cause ◽  
Artificial Lift ◽  
Electrical Submersible Pumps ◽  
Cause Of Failure ◽  
Water Cut ◽  
Discharge Pressure

Abstract PETRONAS had embarked on an ambitious thru tubing ESP journey in 2016 and had installed global first truly rig less offshore Thru Tubing ESP (TTESP) in 2017. To replicate the success of the first installation, TTESP's were installed in Field – T. However, all these three TTESP's failed to produce fluids to surface. This paper provides the complete details of the troubleshooting exercise that was done to find the cause of failure in these wells. The 3 TTESP's in Field – T were installed as per procedure and was ready to be commissioned. However, during the commissioning, it was noticed that the discharge pressure of the ESP did not build-up and the TTESP's tripped due to high temperature after 15 – 30 mins of operation. Hence none of the 3 TTESP's could be successfully commissioned. Considering the strategic importance of TTESP's in PETRONAS's artificial lift plans, detailed troubleshooting exercise was done to find the root cause of failure to produce in these three wells. This troubleshooting exercise included diesel bull heading which gave some key pump performance related data. The three TTESP's installed in Field – T were of size 2.72" and had the potential to produce an average 1500 BLPD at 80% water cut. The TTESP deployment was fully rigless and was installed using 0.8" ESP power cable. The ESP and the cable was hung-off from the surface using a hanger – spool system. The entire system is complex, and the installation procedure needs to be proper to ensure a successful installation. The vast amount of data gathered during the commissioning and troubleshooting exercise was used for determining the failure reason and included preparation of static and dynamic well ESP model. After detailed technical investigative work, the team believes to have found the root cause of the issue which explains the data obtained during commission and troubleshooting phase. The detailed troubleshooting workflow and actual data obtained will be presented in this paper. A comprehensive list of lessons learnt will also be presented which includes very important aspects that needs to be considered during the design and installation of TTESP. The remedial plan is finalized and will be executed during next available weather window. The key benefit of a TTESP installation is its low cost which is 20% – 30% of a rig-based ESP workover in offshore. Hence it is expected that TTESP installations will pick-up globally and it's important for any operator to fully understand the TTESP systems and the potential pain points. PETRONAS has been a pioneer in TTESP field, and this paper will provide details on the learning curve during the TTESP journey.

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