APPLICATION OF TIME-REVERSAL METHOD USING TOPOLOGICAL SENSITIVITY FOR DEFECT DETECTION TO 3-D MATRIX ARRAY TESTING
2019 ◽
Vol 75
(2)
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pp. I_41-I_49
Keyword(s):
2018 ◽
Vol 74
(2)
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pp. I_85-I_93
Keyword(s):
2020 ◽
Vol 76
(2)
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pp. I_15-I_24
2020 ◽
Vol 2020.28
(0)
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pp. 110
2011 ◽
Vol 12
(3)
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pp. 427-434
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2019 ◽
Vol 2019.27
(0)
◽
pp. 106
2019 ◽
Vol 1168
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pp. 032140