scholarly journals Soft X-Ray Optics. Brief History of Multilayer Mirrors for Soft X-Ray Optics. I. Discovery of the Potential of Large D-Spacing Bragg-Reflectors for X-Ray/EUV Applications and Their Development from the Early 1970's to the Late 1980's.

1997 ◽  
Vol 25 (5) ◽  
pp. 339-347 ◽  
Author(s):  
Hisataka TAKENAKA
Keyword(s):  
Bragg Reflectors ◽  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray ◽  
History Of

Soft X-Ray Optics Using Multilayer Mirrors

1985 ◽  
Vol 24 (1) ◽  
Author(s):  
Ping Lee ◽  
Roger J. Bartlett ◽  
Don R. Kania
Keyword(s):  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray

Development of multilayer mirrors for space-based astronomical X-ray optics

2017 ◽  
Vol 47 (1) ◽  
pp. 91-95 ◽  
Author(s):  
Singam S. Panini ◽  
M. Nayak ◽  
K. C. Shyama Narendranath ◽  
P. C. Pradhan ◽  
P. S. Athiray ◽  
...  
Keyword(s):  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray

Optimization of platinum–carbon multilayer mirrors for hard X-ray optics

2006 ◽  
Vol 268 (1) ◽  
pp. 84-89 ◽  
Author(s):  
S.M. Al-Marzoug ◽  
R.J.W. Hodgson
Keyword(s):  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray

Tests and characterization of a laterally graded multilayer Montel mirror

2013 ◽  
Vol 21 (1) ◽  
pp. 16-23 ◽  
Author(s):  
K. Mundboth ◽  
J. Sutter ◽  
D. Laundy ◽  
S. Collins ◽  
S. Stoupin ◽  
...  
Keyword(s):  
Experimental Data ◽  
High Resolution ◽  
Ray Tracing ◽  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering

Multilayers are becoming an increasingly important tool in X-ray optics. The essential parameters to design a pair of laterally graded multilayer mirrors arranged in a Montel-type configuration for use as an X-ray collimating device are provided. The results of X-ray reflectometry tests carried out on the optics in addition to metrology characterization are also shown. Finally, using experimental data and combined with X-ray tracing simulations it is demonstrated that the mirror meets all stringent specifications as required for a novel ultra-high-resolution inelastic X-ray scattering spectrometer at the Advanced Photon Source.

scholarly journals X-ray optics for X-ray laser research applications

1991 ◽  
Vol 9 (1) ◽  
pp. 71-90 ◽  
Author(s):  
N. M. Ceglio
Keyword(s):  
High Intensity ◽  
State Of The Art ◽  
Laser Cavity ◽  
Multilayer Mirrors ◽  
Ray Optics ◽  
X Ray

State of the art capabilities in soft X-ray lenses, multilayer mirrors, beamsplitters, and synthetically generated holograms are reviewed. Application of these capabilities in recent X-ray laser cavity experiments, and to the development of a soft X-ray interferometer and a high intensity (≥1013 watt/cm2) soft X-ray laser are discussed.

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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