Bias in calculated k{sub eff} from subcritical measurements by the {sup 252}Cf-source-driven noise analysis method
2014 ◽
Vol 71
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pp. 245-253
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Keyword(s):
2015 ◽
Vol 76
◽
pp. 521-529
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1991 ◽
Vol 108
(4)
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pp. 341-346
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1991 ◽
Vol 74
(4)
◽
pp. 41-50
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Keyword(s):
2018 ◽
Vol XLII-3
◽
pp. 679-684