scholarly journals Production Test No. 105-1-P: Effect of pile operation on the characteristics of the graphite filler (Wigner disease)

10.2172/86180 ◽  
1944 ◽  
Author(s):  
P.W. Crane
Keyword(s):  
Production Test ◽  
Pile Operation

Failure Analysis of CDM-ESD Damage in a GaAs RFIC

2000 ◽  
Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava
Keyword(s):  
Radio Frequency ◽  
Failure Analysis ◽  
Integrated Circuit ◽  
Production Test ◽  
Analysis Techniques ◽  
Device Model ◽  
Charged Device ◽  
Subsequent Failure

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.

ATE Failure Isolation Methodologies for Failure Analysis, Design Debug and Yield Enhancement

1998 ◽  
Author(s):  
D.S. Patrick ◽  
L.C. Wagner ◽  
P.T. Nguyen
Keyword(s):  
Integrated Circuits ◽  
Failure Analysis ◽  
Yield Enhancement ◽  
Production Test ◽  
Final Test ◽  
Critical Design ◽  
The Past ◽  
Product Engineering ◽  
Time Savings ◽  
Analysis Design

Abstract Failure isolation and debug of CMOS integrated circuits over the past several years has become increasingly difficult to perform on standard failure analysis functional testers. Due to the increase in pin counts, clock speeds, increased complexity and the large number of power supply pins on current ICS, smaller and less equipped testers are often unable to test these newer devices. To reduce the time of analysis and improve the failure isolation capabilities for failing ICS, failure isolation is now performed using the same production testers used in product development, multiprobe and final test. With these production testers, the test hardware, program and pattern sets are already available and ready for use. By using a special interface that docks the production test head to failure isolation equipment such as the emission microscope, liquid crystal station and E-Beam prober, the analyst can quickly and easily isolate the faillure on an IC. This also enables engineers in design, product engineering and the waferfab yield enhancement groups to utilize this equipment to quickly solve critical design and yield issues. Significant cycle time savings have been achieved with the migration to this method of electrical stimulation for failure isolation.

Temperature-Dependent Logic Failure in a GaAs Power Amplifier-Duplexer Module Caused by a Subtle Parasitic Schottky Diode

2014 ◽  
Author(s):  
Rose Emergo ◽  
Steve Brockett ◽  
Pat Hamilton
Keyword(s):  
Power Amplifier ◽  
Schottky Diode ◽  
Production Test ◽  
Temperature Dependent ◽  
Cold Temperatures ◽  
Collector Junction ◽  
Power Mode ◽  
The Difference ◽  
Base Contact ◽  
Single Power

Abstract A single power amplifier-duplexer device was submitted by a customer for analysis. The device was initially considered passing when tested against the production test. However, further electrical testing suggested that the device was stuck in a single power mode for a particular frequency band at cold temperatures only. This paper outlines the systematic isolation of a parasitic Schottky diode formed by a base contactcollector punch through process defect that pulled down the input of a NOR gate leading to the incorrect logic state. Note that this parasitic Schottky diode is parallel to the basecollector junction. It was observed that the logic failure only manifested at colder temperatures because the base contact only slightly diffused into the collector layer. Since the difference in the turn-on voltages between the base-collector junction and the parasitic Schottky diode increases with decreasing temperature, the effect of the parasitic diode is only noticeable at lower temperatures.

Development of a speech production test in Azeri Turkish speaking children

2021 ◽  
pp. 1-10
Author(s):  
Hosein Nojavan-Pirehyousefan ◽  
Talieh Zarifian ◽  
Akram Ahmadi ◽  
Ali Jahan ◽  
Robab Teymouri ◽  
...  
Keyword(s):  
Speech Production ◽  
Production Test

Control of Volumetric Properties of Hot-Mix Asphalt by Field Management

1996 ◽  
Vol 1543 (1) ◽  
pp. 125-131
Author(s):  
Prithvi S. Kandhal ◽  
Kee Y. Foo ◽  
John A. D'Angelo
Keyword(s):  
Hot Mix Asphalt ◽  
Linear Regression Analysis ◽  
Volumetric Properties ◽  
Production Test ◽  
Independent Variables ◽  
Dependent Variables ◽  
Preceding Work ◽  
Multiple Variable ◽  
Asphalt Content ◽  
Variable Analysis

Significant differences in the volumetric properties of laboratory-designed and plant-produced hot-mix asphalt (HMA) generally exist as demonstrated by FHWA Demonstration Project No. 74. The volumetric properties include voids in the mineral aggregate (VMA) and voids in the total mix (VTM). Guidelines for HMA contractors are needed to reconcile these differences and maintain control of volumetric properties during HMA production. The HMA mix design and field production test data (such as asphalt content, gradation, and volumetric properties) from 24 FHWA demonstration projects were entered into a data base and statistically analyzed. The objective was to identify and, if possible, quantify the independent variables (such as asphalt content and the percentages of material passing the No. 200 and other sieves) that significantly affect dependent variables VMA and VTM. The statistical analysis methods consisted of correlation analysis, stepwise multiple-variable analysis, and linear-regression analysis. On the basis of preceding work, guidelines have been developed for HMA contractors to reconcile the differences between the volumetric properties of the job mix formula and the produced HMA mix.

scholarly journals Diphtheria-tetanus-pertussis vaccine combined with Bordetella parapertussis vaccine

1962 ◽  
Vol 60 (3) ◽  
pp. 289-293 ◽  
Author(s):  
Neda Köhler-Kubelka
Keyword(s):  
Clinical Examination ◽  
Pertussis Vaccine ◽  
Bordetella Pertussis ◽  
Whooping Cough ◽  
Production Test ◽  
Post Vaccination ◽  
Bordetella Parapertussis ◽  
Cross Reactions ◽  
Combined Vaccine

Investigations carried out to ascertain the ability of various strains of Bordetella pertussis and B. parapertussis to produce agglutinins have shown that the agglutinin response is considerably greater with B. parapertussis.Children inoculated with a combined vaccine in which the parapertussis element contained B. parapertussis in only one-twelfth of the concentration of B. pertussis in the pertussis element showed agglutinins in their sera in titres well above 1:300 for both organisms. There were no cross-reactions and the serological responses were specific throughout. The vaccine used was the standard diphtheria-tetanus-pertussis (DTP) prophylactic to which had been added a vaccine prepared from recently isolated strains of B. parapertussis.Agglutinin titres of both whooping cough components with the combined vaccine were somewhat lower in mice than was the case when monovalent vaccines were used, but they were considered to be satisfactory.It is suggested that the agglutination production test in mice could be used for the assessment of protective power of B. parapertussis vaccines against infection.I wish to thank Dr Ikić, director of the Institute of Immunology, Zagreb, who enabled me to perform all these examinations, further to Dr B. Mravunac and Dr Z. Radanov for having carried out vaccination in children and for the clinical examination of post vaccination reactions.

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