scholarly journals High Spatial Resolution Grain Orientation and Strain Mapping in Thin Films using Polychromatic Submicron X-ray Diffraction

2002 ◽  
Author(s):  
Jamshed R Patel
Keyword(s):  
Thin Films ◽  
Spatial Resolution ◽  
Grain Orientation ◽  
High Spatial Resolution ◽  
X Ray Diffraction ◽  
Strain Mapping ◽  
X Ray

scholarly journals High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction

2002 ◽  
Vol 80 (20) ◽  
pp. 3724-3726 ◽  
Author(s):  
N. Tamura ◽  
A. A. MacDowell ◽  
R. S. Celestre ◽  
H. A. Padmore ◽  
B. Valek ◽  
...  
Keyword(s):  
Thin Films ◽  
Spatial Resolution ◽  
Grain Orientation ◽  
High Spatial Resolution ◽  
X Ray Diffraction ◽  
Strain Mapping ◽  
X Ray

Microscale Laser Shock Peening of Thin Films, Part 2: High Spatial Resolution Material Characterization

2004 ◽  
Vol 126 (1) ◽  
pp. 18-24 ◽  
Author(s):  
Wenwu Zhang ◽  
Y. Lawrence Yao ◽  
I. C. Noyan
Keyword(s):  
Thin Films ◽  
Spatial Resolution ◽  
Strain Field ◽  
High Spatial Resolution ◽  
Laser Shock Peening ◽  
Laser Shock ◽  
Stress Strain ◽  
Crystal Silicon ◽  
X Ray ◽  
Shock Peening

Microscale Laser Shock Peening (LSP) is a technique that can be potentially applied to manipulate the residual stress distributions in metal film structures and thus improve the reliability of micro-devices. This paper reports high-spatial-resolution characterization of shock treated copper thin films on single-crystal silicon substrates, where scanning x-ray microtopography is used to map the relative variation of the stress/strain field with micron spatial resolution, and instrumented nanoindentation is applied to measure the distribution of hardness and deduce the sign of the stress/strain field. The measurement results are also compared with 3-D simulation results. The general trends in simulations agree with those from experimental measurements. Simulations and experiments show that there is a near linear correlation between strain energy density at the film-substrate interface and the X-ray diffraction intensity contrast.

Effect of Coating with Hydroxyapatite on the Bonding of Bone to Implant

2012 ◽  
Vol 706-709 ◽  
pp. 1661-1666
Author(s):  
Abdelilah Benmarouane ◽  
Pierre Millet ◽  
Thomas Buslaps ◽  
Alain Lodini ◽  
Veijo Honkimäki
Keyword(s):  
Synchrotron Radiation ◽  
Spatial Resolution ◽  
Orthopaedic Surgery ◽  
High Spatial Resolution ◽  
High Energy ◽  
Direct Connection ◽  
X Ray Diffraction ◽  
X Ray ◽  
Natural Bone ◽  
Non Destructive

The aim of the present study was to study the interface implant-bone by synchrotron radiation, the implant has two faces the first one coated with hydroxyapatite and the second uncoated. In orthopaedic surgery, Titanium (Ti-Al-4V) implants are currently coated with hydroxyapatite (HAp), Ca10(PO4)6(OH)2, in order to obtain a stable and functional direct connection between the bone and the implant. At the implant-bone interface, the new bone reconstituted after two months of implantation must have the same properties like the natural bone in order to accept the implant. Therefore we studied the texture of the reconstituted bone crystals at the interface applying non destructive x-ray diffraction. The required high spatial resolution was achieved utilizing high-energy synchrotron radiation on ID15 at ESRF in Grenoble, France.

Electrodeposition of Cu2ZnSnS4 Thin Films Using Ionic Liquids

2008 ◽  
Vol 1123 ◽  
Author(s):  
C.P. Chan ◽  
H. Lam ◽  
K.Y. Wong ◽  
C. Surya
Keyword(s):  
Thin Films ◽  
Ionic Liquid ◽  
Ionic Liquids ◽  
Grain Orientation ◽  
Absorption Measurement ◽  
Elementary Sulfur ◽  
Sulfur Vapor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Czts Thin Films

AbstractWe report the growth of Cu2ZnSnS4 (CZTS) thin films by electrodeposition in ionic liquid. Sulfurization was performed in elementary sulfur vapor environment at 450°C for 2 hours. The X-ray diffraction analysis indicated that the film has a stannite structure with preferred grain orientation along (112). Photo-absorption measurement of the sample was performed from 500 nm to 990 nm. It is found that the energy bandgap of the film is about 1.49eV and the absorption coefficient is found to be of the order of 104cm-1.

High spatial resolution, high energy synchrotron x-ray diffraction characterization of residual strains and stresses in laser shock peened Inconel 718SPF alloy

2012 ◽  
Vol 111 (8) ◽  
pp. 084904 ◽  
Author(s):  
Amrinder S. Gill ◽  
Zhong Zhou ◽  
Ulrich Lienert ◽  
Jonathan Almer ◽  
David F. Lahrman ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
High Energy ◽  
Laser Shock ◽  
X Ray Diffraction ◽  
X Ray ◽  
Residual Strains

Application of the White/Monochromatic X-Ray μ-Diffraction Technique to the Study of Texture and Triaxial Strain at the Submicron Level

2005 ◽  
Vol 490-491 ◽  
pp. 672-677 ◽  
Author(s):  
Philippe Goudeau ◽  
Nobumichi Tamura ◽  
R. Spolenak ◽  
H.A. Padmore
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Trace Elements ◽  
Grain Orientation ◽  
High Spatial Resolution ◽  
Environmental Sciences ◽  
X Ray ◽  
Distribution Maps ◽  
Strain Stress ◽  
Diffraction Patterns

A scanning X-ray microdiffraction beamline using white or monochromatic beam has been recently made available to the user’s community at the Advanced Light Source, Berkeley, USA. Samples are scanned under an X-ray beam with size ranging from 15 microns down to less than a micron, and 2D diffraction patterns are collected at each step. A specifically written software allows for the full treatments of these patterns to obtain as outputs high spatial resolution grain orientation, strain/stress or mineral species distribution maps. The range of applications of this technique goes from the study of the mechanical properties of thin films to the understanding of trace elements speciation in environmental sciences.

X-ray film as a two-dimensional detector for X-ray diffraction analysis

2003 ◽  
Vol 18 (2) ◽  
pp. 91-98 ◽  
Author(s):  
T. N. Blanton
Keyword(s):  
Diffraction Analysis ◽  
Spatial Resolution ◽  
Diffraction Data ◽  
High Spatial Resolution ◽  
Silver Halide ◽  
X Rays ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Film Composition ◽  
X Ray

Silver halide based photographic imaging elements have been utilized as detectors for X-rays for over 100 years. These elements comprised of gelatin dispersed silver halide coated on one or both sides of a support, have been utilized in diffraction experiments since the discovery of X-ray diffraction by Laue and co-workers. X-ray film has high spatial resolution and can be adapted to flat or curved two-dimensional detection geometries. This paper describes the use of X-ray film as a two-dimensional detector for X-ray diffraction analysis, and discusses X-ray film composition, exposure, and processing, along with considerations for analyzing X-ray diffraction data collected using X-ray film.

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