Computer controlled data measurement and analysis system used for measuring switching parameters of semiconductors. [Employs HP 2114B minicomputer; reports contain all applicable coding in assembly language]
Keyword(s):
1981 ◽
Vol 39
◽
pp. 236-237
Keyword(s):
Keyword(s):
2005 ◽
pp. 377-379
1987 ◽
Vol 20
(4)
◽
pp. 307-322
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