scholarly journals Common cause evaluations in applied risk analysis of nuclear power plants. [PWR]

1983 ◽  
Author(s):  
T. Taniguchi ◽  
D. Ligon ◽  
M. Stamatelatos
Author(s):  
Bruce Geddes ◽  
Ray Torok

The Electric Power Research Institute (EPRI) is conducting research in cooperation with the Nuclear Energy Institute (NEI) regarding Operating Experience of digital Instrumentation and Control (I&C) systems in US nuclear power plants. The primary objective of this work is to extract insights from US nuclear power plant Operating Experience (OE) reports that can be applied to improve Diversity and Defense in Depth (D3) evaluations and methods for protecting nuclear plants against I&C related Common Cause Failures (CCF) that could disable safety functions and thereby degrade plant safety. Between 1987 and 2007, over 500 OE events involving digital equipment in US nuclear power plants were reported through various channels. OE reports for 324 of these events were found in databases maintained by the Nuclear Regulatory Commission (NRC) and the Institute of Nuclear Power Operations (INPO). A database was prepared for capturing the characteristics of each of the 324 events in terms of when, where, how, and why the event occurred, what steps were taken to correct the deficiency that caused the event, and what defensive measures could have been employed to prevent recurrence of these events. The database also captures the plant system type, its safety classification, and whether or not the event involved a common cause failure. This work has revealed the following results and insights: - 82 of the 324 “digital” events did not actually involve a digital failure. Of these 82 non-digital events, 34 might have been prevented by making full use of digital system fault tolerance features. - 242 of the 324 events did involve failures in digital systems. The leading contributors to the 242 digital failures were hardware failure modes. Software change appears as a corrective action twice as often as it appears as an event root cause. This suggests that software features are being added to avoid recurrence of hardware failures, and that adequately designed software is a strong defensive measure against hardware failure modes, preventing them from propagating into system failures and ultimately plant events. 54 of the 242 digital failures involved a Common Cause Failure (CCF). - 13 of the 54 CCF events affected safety (1E) systems, and only 2 of those were due to Inadequate Software Design. This finding suggests that software related CCFs on 1E systems are no more prevalent than other CCF mechanisms for which adherence to various regulations and standards is considered to provide adequate protection against CCF. This research provides an extensive data set that is being used to investigate many different questions related to failure modes, causes, corrective actions, and other event attributes that can be compared and contrasted to reveal useful insights. Specific considerations in this study included comparison of 1E vs. non-1E systems, active vs. potential CCFs, and possible defensive measures to prevent these events. This paper documents the dominant attributes of the evaluated events and the associated insights that can be used to improve methods for protecting against digital I&C related CCFs, applying a test of reasonable assurance.


Author(s):  
Steve Yang ◽  
Jun Ding ◽  
Huifang Miao ◽  
Jianxiang Zheng

All 1000 MW nuclear power plants currently in construction or projected to-be-built in China will use the digital instrumentation and control (I&C) systems. Safety and reliability are the ultimate concern for the digital I&C systems. To obtain high confidence in the safety of digital I&C systems, rigorous software verification and validation (V&V) life-cycle methodologies are necessary. The V&V life-cycle process ensures that the requirements of the system and software are correct, complete, and traceable; that the requirements at the end of each life-cycle phase fulfill the requirements imposed by the previous phase; and the final product meets the user-specified requirements. The V&V process is best illustrated via the so-called V-model. This paper describes the V-model in detail by some examples. Through the examples demonstration, it is shown that the process detailed in the V-model is consistent with the IEEE Std 1012-1998, which is endorsed by the US Regulatory Guide 1.168-2004. The examples show that the V-model process detailed in this paper provides an effective V&V approach for digital I&C systems used in nuclear power plants. Additionally, in order to obtain a qualitative mathematical description of the V-model, we study its topological structure in graph theory. This study confirms the rationality of the V-model. Finally, the V&V approach affording protection against common-cause failure from design deficiencies, and manufacturing errors is explored. We conclude that rigorous V&V activities using the V-model are creditable in reducing the risk of common-cause failures.


Risk Analysis ◽  
1985 ◽  
Vol 5 (1) ◽  
pp. 33-51 ◽  
Author(s):  
Mardyros Kazarians ◽  
Nathan O. Siu ◽  
George Apostolakis

2018 ◽  
Vol 51 (24) ◽  
pp. 1364-1367
Author(s):  
Yuxin Zhang ◽  
LU Hongxing ◽  
Ming Yang ◽  
Hidekazu Yoshikawa

Risk Analysis ◽  
1983 ◽  
Vol 3 (3) ◽  
pp. 169-180 ◽  
Author(s):  
Stan Kaplan ◽  
Harold F. Perla ◽  
Dennis C. Bley

Sign in / Sign up

Export Citation Format

Share Document