scholarly journals High power, short pulses ultraviolet laser for the development of a new x-ray laser

1989 ◽  
Author(s):  
L. Meixler ◽  
C.H. Nam ◽  
J. Robinson ◽  
W. Tighe ◽  
K. Krushelnick ◽  
...  
2016 ◽  
Vol 24 (3S2) ◽  
pp. 91-102
Author(s):  
Pham Hong Minh ◽  
Pham Van Duong ◽  
Pham Huy Thong ◽  
Do Quoc Khanh ◽  
Nguyen Dai Hung ◽  
...  

We review the recent progresses in generation and amplification of ultraviolet laser emissions using Ce$^{3 + }$:LiCaAlF$_{6}$ (Ce:LiCAF) material as a gain medium. Basing on comparative studies, we have investigated improvements and proposed possibilities to generate and amplify ultraviolet short-pulse Ce:LiCAF laser emission to high peak power of terawatt.


2017 ◽  
Vol 7 (7) ◽  
pp. 671 ◽  
Author(s):  
Toshiaki Inada ◽  
Takayuki Yamazaki ◽  
Tomohiro Yamaji ◽  
Yudai Seino ◽  
Xing Fan ◽  
...  

2021 ◽  
Vol 79 (6) ◽  
pp. 631-640
Author(s):  
Takaaki Tsunoda ◽  
Takeo Tsukamoto ◽  
Yoichi Ando ◽  
Yasuhiro Hamamoto ◽  
Yoichi Ikarashi ◽  
...  

Electronic devices such as medical instruments implanted in the human body and electronic control units installed in automobiles have a large impact on human life. The electronic circuits in these devices require highly reliable operation. Radiographic testing has recently been in strong demand as a nondestructive way to help ensure high reliability. Companies that use high-density micrometer-scale circuits or lithium-ion batteries require high speed and high magnification inspection of all parts. The authors have developed a new X-ray source supporting these requirements. The X-ray source has a sealed tube with a transmissive target on a diamond window that offers advantages over X-ray sources having a sealed tube with a reflective target. The X-ray source provides high-power-density X-ray with no anode degradation and a longer shelf life. In this paper, the authors will summarize X-ray source classification relevant to electronic device inspection and will detail X-ray source performance requirements and challenges. The paper will also elaborate on technologies employed in the X-ray source including tube design implementations for high-power-density X-ray, high resolution, and high magnification simultaneously; reduced system downtime for automated X-ray inspection; and reduced dosages utilizing quick X-ray on-and-off emission control for protection of sensitive electronic devices.


2021 ◽  
Vol 47 (7) ◽  
pp. 669-703
Author(s):  
V. V. Aleksandrov ◽  
M. M. Basko ◽  
A. V. Branitskii ◽  
E. V. Grabovsky ◽  
A. N. Gritsuk ◽  
...  
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