scholarly journals Full-solid-angle photoelectron diffraction from bulk and surface atoms of clean W(110)

1997 ◽  
Author(s):  
R. X. Ynzunza ◽  
E. D. Tober ◽  
F. J. Palomares ◽  
Z. Wang ◽  
H. Daimon ◽  
...  
Keyword(s):  
Solid Angle ◽  
Photoelectron Diffraction

Structure determination for saturated (1×1) oxygen on W(110) from full solid angle photoelectron diffraction with chemical-state resolution

1999 ◽  
Vol 442 (1) ◽  
pp. 27-35 ◽  
Author(s):  
R.X. Ynzunza ◽  
F.J. Palomares ◽  
E.D. Tober ◽  
Z. Wang ◽  
J. Morais ◽  
...  
Keyword(s):  
Structure Determination ◽  
Solid Angle ◽  
Chemical State ◽  
Photoelectron Diffraction

scholarly journals Full solid angle photoelectron diffraction from bulk and surface atoms of clean W(110)

1999 ◽  
Vol 441 (2-3) ◽  
pp. 301-310 ◽  
Author(s):  
R.X. Ynzunza ◽  
E.D. Tober ◽  
F.J. Palomares ◽  
Z. Wang ◽  
H. Daimon ◽  
...  
Keyword(s):  
Solid Angle ◽  
Photoelectron Diffraction

Direct structure analysis of W(110)-(1×1)-O by full solid-angle X-ray photoelectron diffraction with chemical-state resolution

1998 ◽  
Vol 408 (1-3) ◽  
pp. 260-267 ◽  
Author(s):  
Hiroshi Daimon ◽  
Ramon Ynzunza ◽  
Javier Palomares ◽  
H Takabi ◽  
Charles S Fadley
Keyword(s):  
Structure Analysis ◽  
Solid Angle ◽  
Chemical State ◽  
X Ray ◽  
Photoelectron Diffraction

scholarly journals Study of the oxidation of W(110) by full-solid-angle photoelectron diffraction with chemical state and time resolution

1997 ◽  
Author(s):  
R. X. Ynzunza ◽  
F. J. Palomares ◽  
E. D. Tober ◽  
Z. Wang ◽  
J. Morais ◽  
...  
Keyword(s):  
Time Resolution ◽  
Solid Angle ◽  
Chemical State ◽  
Photoelectron Diffraction

X-RAY PHOTOELECTRON DIFFRACTION STUDY OF A LONG-RANGE-ORDERED ACETATE LAYER ON Ni(110)

2000 ◽  
Vol 07 (01n02) ◽  
pp. 25-36 ◽  
Author(s):  
M. NOWICKI ◽  
A. EMUNDTS ◽  
J. WERNER ◽  
G. PIRUG ◽  
H. P. BONZEL
Keyword(s):  
Room Temperature ◽  
Solid Angle ◽  
Single Scattering ◽  
Real Space ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Acetate Complex ◽  
Cluster Calculations ◽  
Model Layer ◽  
Good Agreement

An investigation of acetic acid adsorption on Ni(110) at room temperature by LEED and X-ray photoelectron diffraction reveals a well-ordered c(2 × 2) acetate overlayer with a molecular coverage near 0.5. Large solid angle maps of angle-resolved C 1s and O 1s intensities from this layer show intense maxima due to electron forward scattering by nearby atoms, either of the same acetate or of neighboring acetate species. The data provide strong evidence for acetate in a bidentate configuration, bonded through both oxygen atoms to the surface and aligned along the [Formula: see text] surface azimuth. A real space model for the c(2 × 2) acetate layer has been derived and single scattering cluster calculations for this model layer have been carried out for C 1s and O 1s emissions. Allowing for changes in intramolecular bond length of the acetate relative to those in a Ni-acetate complex, good agreement between experimental and theoretical C 1s and O 1s distributions was obtained.

Optimizing conditions for x-ray microchemical analysis in analytical electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 548-549 ◽  
Author(s):  
N. J. Zaluzec
Keyword(s):  
Solid Angle ◽  
Analytical Electron Microscopy ◽  
Incident Beam ◽  
Thin Foil ◽  
Experimental Conditions ◽  
X Ray ◽  
Microchemical Analysis ◽  
Analytical Electron ◽  
Image Position ◽  
Incident Beam Energy

The ultimate sensitivity of microchemical analysis using x-ray emission rests in selecting those experimental conditions which will maximize the measured peak-to-background (P/B) ratio. This paper presents the results of calculations aimed at determining the influence of incident beam energy, detector/specimen geometry and specimen composition on the P/B ratio for ideally thin samples (i.e., the effects of scattering and absorption are considered negligible). As such it is assumed that the complications resulting from system peaks, bremsstrahlung fluorescence, electron tails and specimen contamination have been eliminated and that one needs only to consider the physics of the generation/emission process.The number of characteristic x-ray photons (Ip) emitted from a thin foil of thickness dt into the solid angle dΩ is given by the well-known equation

Contrast in Scanning Images of Thin Crystals

1972 ◽  
Vol 30 ◽  
pp. 520-521
Author(s):  
S. Kimoto ◽  
H. Hashimoto ◽  
S. Takashima ◽  
R. M. Stern ◽  
T. Ichinokawa
Keyword(s):  
Crystal Surface ◽  
Solid Angle ◽  
Incident Angle ◽  
Intensity Variation ◽  
Lattice Defects ◽  
Scanning Microscope ◽  
Electron Detector ◽  
Backscattered Electrons ◽  
Electron Image ◽  
Backscattered Electron

The most well known application of the scanning microscope to the crystals is known as Coates pattern. The contrast of this image depends on the variation of the incident angle of the beam to the crystal surface. The defect in the crystal surface causes to make contrast in normal scanning image with constant incident angle. The intensity variation of the backscattered electrons in the scanning microscopy was calculated for the defect in the crystals by Clarke and Howie. Clarke also observed the defect using a scanning microscope.This paper reports the observation of lattice defects appears in thin crystals through backscattered, secondary and transmitted electron image. As a backscattered electron detector, a p-n junction detector of 0.9 π solid angle has been prepared for JSM-50A. The gain of the detector itself is 1.2 x 104 at 50 kV and the gain of additional AC amplifier using band width 100 Hz ∼ 10 kHz is 106.

High spatial resolution x-ray microanalysis of interfaces

1995 ◽  
Vol 53 ◽  
pp. 284-285
Author(s):  
J. R. Michael
Keyword(s):  
Spatial Resolution ◽  
Electron Probe ◽  
Solid Angle ◽  
Collection Efficiency ◽  
Spatial Scales ◽  
Energy Dispersive Spectrometer ◽  
X Rays ◽  
X Ray ◽  
Probe Size ◽  
Brightness Field

X-ray microanalysis in the analytical electron microscope (AEM) refers to a technique by which chemical composition can be determined on spatial scales of less than 10 nm. There are many factors that influence the quality of x-ray microanalysis. The minimum probe size with sufficient current for microanalysis that can be generated determines the ultimate spatial resolution of each individual microanalysis. However, it is also necessary to collect efficiently the x-rays generated. Modern high brightness field emission gun equipped AEMs can now generate probes that are less than 1 nm in diameter with high probe currents. Improving the x-ray collection solid angle of the solid state energy dispersive spectrometer (EDS) results in more efficient collection of x-ray generated by the interaction of the electron probe with the specimen, thus reducing the minimum detectability limit. The combination of decreased interaction volume due to smaller electron probe size and the increased collection efficiency due to larger solid angle of x-ray collection should enhance our ability to study interfacial segregation.

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