scholarly journals Mechanical behavior of an axisymmetric solder joint-component system during encapsulation and thermal cycling. Final report

1979 ◽  
Author(s):  
D.M. Jarboe
Keyword(s):  
Solder Joint ◽  
Thermal Cycling ◽  
Mechanical Behavior ◽  
Final Report ◽  
Component System

Thermal Stress Analysis of SMT PQFP Packages and Interconnections

1989 ◽  
Vol 111 (1) ◽  
pp. 2-8 ◽  
Author(s):  
J. H. Lau
Keyword(s):  
Finite Element Method ◽  
Finite Element ◽  
Thermal Stress ◽  
Solder Joint ◽  
Thermal Cycling ◽  
Mechanical Behavior ◽  
Thermal Stresses ◽  
Stress And Strain ◽  
Plastic Analysis ◽  
Chip Carrier

An elasto-plastic analysis of the thermal stresses and strains in a surface mounted plastic-quad-flat-pack (PQFP) assembly by using a 3-D finite element method is presented in this paper. Detailed stress and strain distributions and whole-field displacements of the assembly are also provided for a better understanding of its mechanical behavior during thermal cycling. It was found that the stresses and strains in the PQFP solder joint are smaller than those in the plastic-leaded-chip-carrier (PLCC) solder joint. The results presented herein should be useful in the design for reliability of this class of surface mount assemblies.

scholarly journals Study on the Reliability of Sn–Bi Composite Solder Pastes with Thermosetting Epoxy under Thermal Cycling and Humidity Treatment

Crystals ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 733
Author(s):  
Lu Liu ◽  
Songbai Xue ◽  
Ruiyang Ni ◽  
Peng Zhang ◽  
Jie Wu
Keyword(s):  
Solder Joint ◽  
Thermal Cycling ◽  
Composite Solder ◽  
Solder Joints ◽  
Solder Paste ◽  
Epoxy System ◽  
Mechanical Reinforcement ◽  
Microstructure Observation ◽  
Temperature And Humidity ◽  
Thermosetting Epoxy

In this study, a Sn–Bi composite solder paste with thermosetting epoxy (TSEP Sn–Bi) was prepared by mixing Sn–Bi solder powder, flux, and epoxy system. The melting characteristics of the Sn–Bi solder alloy and the curing reaction of the epoxy system were measured by differential scanning calorimeter (DSC). A reflow profile was optimized based on the Sn–Bi reflow profile, and the Organic Solderability Preservative (OSP) Cu pad mounted 0603 chip resistor was chosen to reflow soldering and to prepare samples of the corresponding joint. The high temperature and humidity reliability of the solder joints at 85 °C/85% RH (Relative Humidity) for 1000 h and the thermal cycle reliability of the solder joints from −40 °C to 125 °C for 1000 cycles were investigated. Compared to the Sn–Bi solder joint, the TSEP Sn–Bi solder joints had increased reliability. The microstructure observation shows that the epoxy resin curing process did not affect the transformation of the microstructure. The shear force of the TSEP Sn–Bi solder joints after 1000 cycles of thermal cycling test was 1.23–1.35 times higher than the Sn–Bi solder joint and after 1000 h of temperature and humidity tests was 1.14–1.27 times higher than the Sn–Bi solder joint. The fracture analysis indicated that the cured cover layer could still have a mechanical reinforcement to the TSEP Sn–Bi solder joints after these reliability tests.

Microstructure evolution observation for SAC solder joint: Comparison between thermal cycling and thermal storage

2009 ◽  
Vol 49 (9-11) ◽  
pp. 1267-1272 ◽  
Author(s):  
M. Berthou ◽  
P. Retailleau ◽  
H. Frémont ◽  
A. Guédon-Gracia ◽  
C. Jéphos-Davennel
Keyword(s):  
Solder Joint ◽  
Thermal Cycling ◽  
Microstructure Evolution ◽  
Thermal Storage ◽  
Sac Solder

scholarly journals Prediction of mechanical properties and fatigue life of nano silver paste in chip interconnection

2020 ◽  
Author(s):  
Hui YANG ◽  
Jihui Wu
Keyword(s):  
Fatigue Life ◽  
Solder Joint ◽  
Thermal Cycling ◽  
Solder Joints ◽  
Stress And Strain ◽  
Nano Silver ◽  
Finite Element Software ◽  
Flip Chips ◽  
Empirical Correction ◽  
Prediction Of Mechanical Properties

Abstract The simulation of nano-silver solder joints in flip-chips is performed by the finite element software ANSYS, and the stress-strain distribution results of the solder joints are displayed. In this simulation, the solder joints use Anand viscoplastic constitutive model, which can reasonably simulate the stress and strain of solder joints under thermal cycling load. At the same time this model has been embedded in ANSYS software, so it is more convenient to use. The final simulation results show that the areas where the maximum stresses and strains occur at the solder joints are mostly distributed in the contact areas between the solder joints and the copper pillars and at the solder joints. During the entire thermal cycling load process, the area where the maximum change in stress and strain occurs is always at the solder joint, and when the temperature changes, the temperature at the solder joint changes significantly. Based on comprehensive analysis, the relevant empirical correction calculation equation is used to calculate and predict the thermal fatigue life of nano-silver solder joints. The analysis results provide a reference for the application of nano-silver solder in the electronic packaging industry.

Reliability analysis of low-Ag BGA solder joints using four failure criteria

2012 ◽  
Vol 2012 (1) ◽  
pp. 000066-000072
Author(s):  
Erin Kimura ◽  
Jianbiao Pan
Keyword(s):  
Solder Joint ◽  
Thermal Cycling ◽  
Failure Criterion ◽  
Control Charts ◽  
Failure Criteria ◽  
Life Estimation ◽  
Resistance Increase ◽  
Estimate Reliability ◽  
Accelerated Thermal Cycling ◽  
Selection Of

The appropriate selection of failure criterion for solder joint studies is necessary to correctly estimate reliability life. The objective of this study is to compare the effect of different failure criteria on the reliability life estimation. The four failure criteria in this study are a 20% resistance increase defined in the IPC-9701A standard, a resistance beyond 500Ω, an infinite resistance (hard open), and a failure criterion based on X̄ and R control charts. Accelerated thermal cycling conditions of a low-silver BGA study included 0°C to 100 °C with ten minute dwell times and −40°C to 125°C with ten minute dwell times. The results show that the life estimation based on X̄ and R failure criterion is very similar to the life estimation when a 20% resistance increase defined in the IPC-9701A failure criterion is used. The results also show that the reliability life would be overestimated if the failure criterion of a resistance threshold of 500Ω or an infinite resistance (hard open) is used.

The Future of Solder Joint Encapsulant

2015 ◽  
Vol 2015 (1) ◽  
pp. 000644-000648
Author(s):  
Mary Liu ◽  
Wusheng Yin
Keyword(s):  
High Temperature ◽  
Low Temperature ◽  
Solder Joint ◽  
Thermal Cycling ◽  
Lower Cost ◽  
Solder Joints ◽  
Cost Of Ownership ◽  
The Future ◽  
High Temperature Solder

Solder joint encapsulant adhesives have been successfully used to enhance the strength of solder joints and improve thermal cycling as well as drop performance in finished products. The use of solder joint encapsulant adhesives can eliminate the need for underfill materials and the underfill process altogether, thus simplifying rework, which results in a lower cost of ownership. Solder joint encapsulant adhesives include: low temperature and high temperature solder joint encapsulant adhesives, and their derivatives. Each solder joint encapsulant adhesive has: unfilled and filled solder joint encapsulant adhesives, and solder joint encapsulant paste. Each solder joint encapsulant product has been designed for different applications. In this paper, we are going to discuss the details and future of solder joint encapsulant adhesives.

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