scholarly journals Development of a high resolution, cylindrical crystal spectrometer for diagnostics of x rays emitted from hot plasmas. Progress report, August 1, 1978-October 31, 1979

1979 ◽  
Author(s):  
P.O. Taylor ◽  
H. Schnopper
Keyword(s):  
High Resolution ◽  
Progress Report ◽  
X Rays ◽  
Crystal Spectrometer ◽  
Cylindrical Crystal

APPLICATION OF A CHARGE-DIVISION, POSITION-SENSITIVE PROPORTIONAL COUNTER TO HIGH-RESOLUTION PIXE MEASUREMENTS

1990 ◽  
Vol 01 (02) ◽  
pp. 141-146 ◽  
Author(s):  
HIROMI HAMANAKA ◽  
KEN-ICHI HASEGAWA ◽  
YASUHIRO YAMAMOTO
Keyword(s):  
High Resolution ◽  
Carbon Fiber ◽  
Spatial Resolution ◽  
Proportional Counter ◽  
Simple Structure ◽  
Correlation Factor ◽  
X Rays ◽  
Crystal Spectrometer ◽  
Position Sensitive ◽  
A Charge

A charge-division, position-sensitive proportional counter with a carbon-fiber anode and its associated signal processor has been developed. This counter is very small in volume with a simple structure and vacuum proof. The spatial resolution of 0.36 mm was achieved under a gas pressure of 1.7×105 Pa. A correlation factor between the position and the channel number was measured to be 0.97, indicating good linearity of the system. The detector was combined with a crystal spectrometer in order to measure spectra of particle-induced characteristic X rays. Energy resolutions measured at Si Kα (1.74 keV) and Fe Kα (6.4 keV) X rays are 4 and 34 eV, respectively.

High-resolution study of x-rays emitted from highly charged S ions using a bent-crystal spectrometer

2013 ◽  
Vol T156 ◽  
pp. 014009 ◽  
Author(s):  
S Kasthurirangan ◽  
A Banerjee ◽  
A Kumar ◽  
A N Agnihotri ◽  
D Misra ◽  
...  
Keyword(s):  
High Resolution ◽  
X Rays ◽  
Crystal Spectrometer ◽  
Bent Crystal ◽  
Resolution Study

scholarly journals Measurement of synchrotron-radiation-excited Kossel patterns

2016 ◽  
Vol 23 (1) ◽  
pp. 214-218 ◽  
Author(s):  
G. Bortel ◽  
G. Faigel ◽  
M. Tegze ◽  
A. Chumakov
Keyword(s):  
High Resolution ◽  
Dynamic Range ◽  
Structural Information ◽  
Photon Counting ◽  
Spot Size ◽  
Low Noise ◽  
X Rays ◽  
Technical Problems ◽  
Pixel Detectors ◽  
Exciting Beam

Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, two-dimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.

Cryogenic high-resolution X-ray spectrometers for SR-XRF and microanalysis

1998 ◽  
Vol 5 (3) ◽  
pp. 515-517 ◽  
Author(s):  
M. Frank ◽  
C. A. Mears ◽  
S. E. Labov ◽  
L. J. Hiller ◽  
J. B. le Grand ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Resolution ◽  
Superconducting Tunnel Junction ◽  
Semiconductor Detectors ◽  
X Rays ◽  
X Ray ◽  
Sr Xrf ◽  
Demonstration Experiment ◽  
Near Future ◽  
Stj Detector

Experimental results are presented obtained with a cryogenically cooled high-resolution X-ray spectrometer based on a 141 × 141 µm Nb-Al-Al2O3-Al-Nb superconducting tunnel junction (STJ) detector in an SR-XRF demonstration experiment. STJ detectors can operate at count rates approaching those of semiconductor detectors while still providing a significantly better energy resolution for soft X-rays. By measuring fluorescence X-rays from samples containing transition metals and low-Z elements, an FWHM energy resolution of 6–15 eV for X-rays in the energy range 180–1100 eV has been obtained. The results show that, in the near future, STJ detectors may prove very useful in XRF and microanalysis applications.

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