New Concepts in Fish Ladder Design, Volume III of IV, Assessment of Fishway Development and Design, 1982-1983 Final Report.

Abstract. In the last decade, the Nuclear Energy Agency (NEA) of the OECD co-ordinated an international initiative to develop understanding and guidelines related to the longer-term preservation of records, knowledge and memory (RK&M) regarding radioactive waste repositories, the so-called “RK&M Initiative”. Their final report (NEA, 2019) can be read as a general guide to the RK&M preservation topic. In terms of practical support, the group prepared an RK&M preservation toolbox, comprising 35 different preservation mechanisms. Amongst those are classical, much discussed tools such as “archives”, “surface markers” or “land use control”, hitherto less discussed tools such as “international regulations”, “small time capsules” or “clear and planned responsibilities”, and two entirely new concepts: the Set of Essential Records (SER) and the Key Information File (KIF). In the current contribution, I present these two concepts, pointing out their role both in the wider RK&M preservation context (i.e. in the toolbox as a whole) and in the narrower “documents” context. My main focus is a comparative approach, addressing the peculiarities of the KIF and the SER concepts by working out the differences between the two. It becomes apparent that the KIF is far from being a condensation of the SER, but in fact KIF and SER are independent concepts: in terms of their authors/creators, their target audiences, and first and foremost their functioning, i.e. “how” they contribute to RK&M preservation.

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Novel Approaches to Low-Voltage Scanning Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180586 ◽

1990 ◽

Vol 48 (1) ◽

pp. 366-367

Author(s):

Arthur V. Jones

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Electron Optics ◽

Current Interest ◽

New Concepts ◽

Opportune Time ◽

Novel Approaches ◽

Voltage Scanning ◽

Scanning Electron

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.

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