Induced Compton-scattering effects in radiation-transport approximations

In electron scattering measurements of the Compton profiles of solids, multiple scattering events contribute strongly to the observed profile. The dominant contribution to the multiple scattering arises from events in which Bragg scattering is followed by Compton scattering. The Bragg scattering is calculated by using a multi-slice approach that allows for dynamical scattering, and each Bragg beam is then treated as a source of Compton scattering. In this paper, the dependence of multiple scattering on the energy of the incident beam and on the thickness, orientation, crystal structure and atomic number of the sample are investigated to determine the parameters that affect the multiple scattering most strongly, and to seek ways in which multiple scattering can be reduced in experimental work.

Download Full-text

Electron crystallographic determination of the 3-D structure of staurolite at atomic resolution

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010008701x ◽

1991 ◽

Vol 49 ◽

pp. 540-541

Author(s):

Kenneth H. Downing ◽

Hu Meisheng ◽

Hans-Rudolf Went ◽

Michael A. O'Keefe

Keyword(s):

High Resolution ◽

Three Dimensional ◽

High Resolution Electron Microscopy ◽

Atomic Resolution ◽

Dimensional Structure ◽

Structure Information ◽

Resolution Electron ◽

Scattering Effects ◽

High Resolution Images ◽

Effects Of Radiation

With current advances in electron microscope design, high resolution electron microscopy has become routine, and point resolutions of better than 2Å have been obtained in images of many inorganic crystals. Although this resolution is sufficient to resolve interatomic spacings, interpretation generally requires comparison of experimental images with calculations. Since the images are two-dimensional representations of projections of the full three-dimensional structure, information is invariably lost in the overlapping images of atoms at various heights. The technique of electron crystallography, in which information from several views of a crystal is combined, has been developed to obtain three-dimensional information on proteins. The resolution in images of proteins is severely limited by effects of radiation damage. In principle, atomic-resolution, 3D reconstructions should be obtainable from specimens that are resistant to damage. The most serious problem would appear to be in obtaining high-resolution images from areas that are thin enough that dynamical scattering effects can be ignored.

Download Full-text

Dynamical Scattering in Electron Diffraction of wet Protein Crystals

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600000167 ◽

1980 ◽

Vol 38 ◽

pp. 42-43

Author(s):

B. B. Chang ◽

D. F. Parsons

Keyword(s):

Electron Diffraction ◽

Scattering Theory ◽

Protein Crystals ◽

Electron Diffraction Data ◽

Specimen Thickness ◽

Major Question ◽

X Ray ◽

Scattering Effects ◽

Diffraction Patterns ◽

Acceleration Voltage

The significance of dynamical scattering effects remains the major question in the structural analysis by electron diffraction of protein crystals preserved in the hydrated state. In the few cases (single layers of purple membrane and 400-600 Å thick catalase crystals examined at 100 kV acceleration voltage) where electron-diffraction patterns were used quantitatively, dynamical scattering effects were considered unimportant on the basis of a comparison with x-ray intensities. The kinematical treatment is usually justified by the thinness of the crystal. A theoretical investigation by Ho et al. using Cowley-Moodie multislice formulation of dynamical scattering theory and cytochrome b5as the test object2 suggests that kinematical analysis of electron diffraction data with 100-keV electrons would not likely be valid for specimen thickness of 300 Å or more. We have chosen to work with electron diffraction patterns obtained from actual wet protein crystals (rat hemoglobin crystals of thickness range 1000 to 2500 Å) at 200 and 1000 kV and to analyze these for dynamical effects.

Download Full-text