scholarly journals Plane shock initiation of detonation: computer simulation of a gas-gun experiment

1975 ◽  
Author(s):  
W Fickett ◽  
J Jacobson
Keyword(s):  
Computer Simulation ◽  
Plane Shock ◽  
Shock Initiation ◽  
Gas Gun

Plane Shock Initiation of an RDX Plastic‐Bonded Explosive

1966 ◽  
Vol 37 (13) ◽  
pp. 4873-4880 ◽  
Author(s):  
I. E. Lindstrom
Keyword(s):  
Plane Shock ◽  
Shock Initiation

scholarly journals SHOCK INITIATION BEHAVIOR OF PBXN-9 DETERMINED BY GAS GUN EXPERIMENTS

2009 ◽  
Author(s):  
N. J. Sanchez ◽  
R. L. Gustavsen ◽  
D. E. Hooks ◽  
Mark Elert ◽  
Michael D. Furnish ◽  
...  
Keyword(s):  
Shock Initiation ◽  
Gas Gun

Characterization of Modulated Structure Through Structure Images and their Computer Simulation

1990 ◽  
Vol 48 (1) ◽  
pp. 70-71
Author(s):  
Kiyomichi Nakai ◽  
Yusuke Isobe ◽  
Chiken Kinoshita ◽  
Kazutoshi Shinohara
Keyword(s):  
Computer Simulation ◽  
High Resolution ◽  
Spherical Aberration ◽  
High Resolution Electron Microscopy ◽  
Basic Mechanism ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Transmitted Beam ◽  
Modulated Structure ◽  
Resolution Electron

Induced spinodal decomposition under electron irradiation in a Ni-Au alloy has been investigated with respect to its basic mechanism and confirmed to be caused by the relaxation of coherent strain associated with modulated structure. Modulation of white-dots on structure images of modulated structure due to high-resolution electron microscopy is reduced with irradiation. In this paper the atom arrangement of the modulated structure is confirmed with computer simulation on the structure images, and the relaxation of the coherent strain is concluded to be due to the reduction of phase-modulation.Structure images of three-dimensional modulated structure along <100> were taken with the JEM-4000EX high-resolution electron microscope at the HVEM Laboratory, Kyushu University. The transmitted beam and four 200 reflections with their satellites from the modulated structure in an fee Ni-30.0at%Au alloy under illumination of 400keV electrons were used for the structure images under a condition of the spherical aberration constant of the objective lens, Cs = 1mm, the divergence of the beam, α = 3 × 10-4 rad, underfocus, Δf ≃ -50nm and specimen thickness, t ≃ 15nm. The CIHRTEM code was used for the simulation of the structure image.

Sign in / Sign up

Export Citation Format

Share Document