105 K east ion exchange and cartridge filter restart computer software user documentation

Applying normal design and correlative computer software, a new matrix material and an excellent waste formulation were developed. Based on the theory calculations and normal design in this paper, using polymer complex cement as immobilization matrix that mixed with simulating spent ion exchange resin a new waste formulation was carried out. The characterization of solidified waste had been done after 28 days curing. The results conformed to the treatment of the waste about the requests of the national standard [GB14569-93-1]. Leach index of the solidified waste was excellent. An optimized formulation was recommended.

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Embedding Procedure for Water Swollen Samples

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010006951x ◽

1970 ◽

Vol 28 ◽

pp. 504-505

Author(s):

Ann M. Thomas ◽

Virginia Shemeley

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Exchange ◽

Structural Changes ◽

Cross Linking ◽

Ion Exchange Resins ◽

Transmission Electron ◽

First Pass ◽

Exchange Resins

Those samples which swell rapidly when exposed to water are, at best, difficult to section for transmission electron microscopy. Some materials literally burst out of the embedding block with the first pass by the knife, and even the most rapid cutting cycle produces sections of limited value. Many ion exchange resins swell in water; some undergo irreversible structural changes when dried. We developed our embedding procedure to handle this type of sample, but it should be applicable to many materials that present similar sectioning difficulties.The purpose of our embedding procedure is to build up a cross-linking network throughout the sample, while it is in a water swollen state. Our procedure was suggested to us by the work of Rosenberg, where he mentioned the formation of a tridimensional structure by the polymerization of the GMA biproduct, triglycol dimethacrylate.

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Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010014484x ◽

1986 ◽

Vol 44 ◽

pp. 694-695

Author(s):

G.Y. Fan ◽

J.M. Cowley

Keyword(s):

Image Processing ◽

Pattern Recognition ◽

Computer Software ◽

Processing System ◽

Light Level ◽

Host Computer ◽

Low Light ◽

Image Processing System ◽

Recent Developments ◽

On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

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Computer-Assisted High-Re Solution TEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100179567 ◽

1990 ◽

Vol 48 (1) ◽

pp. 162-163

Author(s):

F.A. Ponce ◽

H. Hikashi

Keyword(s):

Signal To Noise Ratio ◽

Accurate Determination ◽

Computer Software ◽

Video Camera ◽

Image Contrast ◽

Objective Lens ◽

Computer Assisted ◽

Optical Parameters ◽

Astigmatism Correction

The determination of the atomic positions from HRTEM micrographs is only possible if the optical parameters are known to a certain accuracy, and reliable through-focus series are available to match the experimental images with calculated images of possible atomic models. The main limitation in interpreting images at the atomic level is the knowledge of the optical parameters such as beam alignment, astigmatism correction and defocus value. Under ordinary conditions, the uncertainty in these values is sufficiently large to prevent the accurate determination of the atomic positions. Therefore, in order to achieve the resolution power of the microscope (under 0.2nm) it is necessary to take extraordinary measures. The use of on line computers has been proposed [e.g.: 2-5] and used with certain amount of success.We have built a system that can perform operations in the range of one frame stored and analyzed per second. A schematic diagram of the system is shown in figure 1. A JEOL 4000EX microscope equipped with an external computer interface is directly linked to a SUN-3 computer. All electrical parameters in the microscope can be changed via this interface by the use of a set of commands. The image is received from a video camera. A commercial image processor improves the signal-to-noise ratio by recursively averaging with a time constant, usually set at 0.25 sec. The computer software is based on a multi-window system and is entirely mouse-driven. All operations can be performed by clicking the mouse on the appropiate windows and buttons. This capability leads to extreme friendliness, ease of operation, and high operator speeds. Image analysis can be done in various ways. Here, we have measured the image contrast and used it to optimize certain parameters. The system is designed to have instant access to: (a) x- and y- alignment coils, (b) x- and y- astigmatism correction coils, and (c) objective lens current. The algorithm is shown in figure 2. Figure 3 shows an example taken from a thin CdTe crystal. The image contrast is displayed for changing objective lens current (defocus value). The display is calibrated in angstroms. Images are stored on the disk and are accessible by clicking the data points in the graph. Some of the frame-store images are displayed in Fig. 4.

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Word Prompt Programs

American Journal of Speech-Language Pathology ◽

10.1044/1058-0360.0603.57 ◽

1997 ◽

Vol 6 (3) ◽

pp. 57-65 ◽

Cited By ~ 5

Author(s):

Lisa A. Wood ◽

Joan L. Rankin ◽

David R. Beukelman

Keyword(s):

Learning Disabilities ◽

Current Literature ◽

Word Processing ◽

Computer Software ◽

Written Language ◽

Written Communication ◽

Speech Language Pathologists ◽

Basic Word ◽

The Matrix ◽

Language Needs

Word prompt programs are computer software programs or program features that are used in addition to basic word processing. These programs provide word lists from which a user selects a desired word and inserts it into a line of text. This software is used to support individuals with severe speech, physical, and learning disabilities. This tutorial describes the features of a variety of word prompt programs and reviews the current literature on the use of these programs by people with oral and written language needs. In addition, a matrix that identifies the features contained in eight sample word prompt programs is provided. The descriptions of features and the matrix are designed to assist speech-language pathologists and teachers in evaluating and selecting word prompt programs to support their clients' oral and written communication.

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