Beam lead device and hybrid microcircuit testing

The Scanning Electron Microscope (SEM) is an important tool in Thick Film Hybrid Microcircuits Manufacturing because of its large depth of focus and three dimensional capability. This paper discusses some of the important areas in which the SEM is used to monitor process control and component failure modes during the various stages of manufacture of a typical hybrid microcircuit.Figure 1 shows a thick film hybrid microcircuit used in a Motorola Paging Receiver. The circuit consists of thick film resistors and conductors screened and fired on a ceramic (aluminum oxide) substrate. Two integrated circuit dice are bonded to the conductors by means of conductive epoxy and electrical connections from each integrated circuit to the substrate are made by ultrasonically bonding 1 mil aluminum wires from the die pads to appropriate conductor pads on the substrate. In addition to the integrated circuits and the resistors, the circuit includes seven chip capacitors soldered onto the substrate. Some of the important considerations involved in the selection and reliability aspects of the hybrid circuit components are: (a) the quality of the substrate; (b) the surface structure of the thick film conductors; (c) the metallization characteristics of the integrated circuit; and (d) the quality of the wire bond interconnections.

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Test Method of Current Leakage for Dielectric Paste

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.220-223.1573 ◽

2012 ◽

Vol 220-223 ◽

pp. 1573-1576

Author(s):

Zhi Hong Hou

Keyword(s):

Glass Substrate ◽

Dielectric Layer ◽

Screen Printing ◽

Test Method ◽

Conducting Layer ◽

Current Leakage ◽

Test Circuit ◽

Conductive Line ◽

Hybrid Microcircuit ◽

Sintering Processes

A test method of current leakage for dielectric paste was proposed by simulating the application processes of dielectric paste for manufacturing the dielectric layer in the multilayer thick film hybrid microcircuit. That is, by screen printing and sintering processes, the sliver conducting layer was fabricated on the surface of glass substrate, and then dielectric layer, finally the glass substrate sample with conducting layer and dielectric layer was dipped in 5 Wt% NaCl aqueous solution. The conductive line was soldered on the silver conducting layer to form the test circuit, and powered with 5 volts direct power, the current in the test circuit was taken as the current leakage of the dielectric paste. The method may be used to evaluate the current leakage of dielectric paste.

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Fatigue failure of encapsulated gold-beam lead and TAB devices

Microelectronics Reliability ◽

10.1016/0026-2714(78)90456-0 ◽

1978 ◽

Vol 18 (4) ◽

pp. 308

Keyword(s):

Fatigue Failure ◽

Beam Lead

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Band widening of NRD guide beam-lead diode devices and their applications to integrated transceivers at 60 GHz

1999 Asia Pacific Microwave Conference. APMC'99. Microwaves Enter the 21st Century. Conference Proceedings (Cat. No.99TH8473) ◽

10.1109/apmc.1999.829795 ◽

2003 ◽

Cited By ~ 1

Author(s):

F. Kuroki ◽

T. Mukai ◽

T. Yoneyama

Keyword(s):

60 Ghz ◽

Nrd Guide ◽

Beam Lead

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The Generation of Switchable Polarized Currents in Nodal Ring Semimetals Using High-Frequency Periodic Driving

Journal of Physics Condensed Matter ◽

10.1088/1361-648x/ac37db ◽

2021 ◽

Author(s):

Pei-Hao Fu ◽

Qianqian Lv ◽

Xiang-Long Yu ◽

Jun-Feng Liu ◽

Jiansheng Wu

Keyword(s):

High Frequency ◽

Surface Currents ◽

Switching Effect ◽

Fermi Arc ◽

Periodically Driven ◽

Weyl Semimetal ◽

Spin Polarized ◽

High Frequency Electromagnetic Field ◽

Polarized Surface ◽

Lead Device

Abstract A nodal ring semimetal (NRSM) can be driven to a spin-polarized NRSM or a spin-polarized Weyl semimetal (SWSM) by a high-frequency electromagnetic field. We investigate the conditions in realizing these phases and propose a switchable spin-polarized currents generator based on periodically driven NRSMs. Both bulk and surface polarized currents are investigated. The polarization of bulk current is sensitive to the amplitude of the driving field and robust against the direction and polarization of the driving, the opaqueness of the lead-device interface and the misalignment between the nodal ring and the interface, which provides sufficient flexibility in manipulating the devices. Similar switchable polarized surface currents are also expected, which is contributed by the Fermi arc surface state associated with the Weyl semimetal (WSM) phases. The generation of polarized currents and the polarization switching effect offer opportunities to design periodic driving controlled topological spintronics devices based on NRSMs.

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