scholarly journals Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion- Focused X-Rayand Pulsed Laser-Induced Charge Generation.

2020 ◽  
Author(s):  
Kaitlyn Ryder ◽  
◽  
Landen Ryder ◽  
Andrew Sternberg ◽  
John Kozub ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Heavy Ion ◽  
Single Event ◽  
Epitaxial Silicon ◽  
Charge Generation ◽  
Silicon Diode ◽  
Single Event Transients ◽  
Induced Charge

Impacts of Proton Radiation on Heavy-Ion-Induced Single-Event Transients in 65-nm CMOS Technology

2019 ◽  
Vol 66 (1) ◽  
pp. 177-183
Author(s):  
Zhenyu Wu ◽  
Shuming Chen ◽  
Jianjun Chen ◽  
Pengcheng Huang
Keyword(s):  
Cmos Technology ◽  
Heavy Ion ◽  
Proton Radiation ◽  
Single Event ◽  
Single Event Transients

Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs

2019 ◽  
Vol 30 (5) ◽  
Author(s):  
Chang Cai ◽  
Tian-Qi Liu ◽  
Xiao-Yuan Li ◽  
Jie Liu ◽  
Zhan-Gang Zhang ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Gate Oxide ◽  
Heavy Ion ◽  
Single Event ◽  
Single Event Effects
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