scholarly journals LAWRENCE LIVERMORE NATIONAL SECURITY, LLCSite 300 Facility ID N-472 Toxics Emissions Inventory Plan for AB 2588 California Air Toxics "Hot Spots" Information and Assessment Act of 1987

2021 ◽  
Author(s):  
G Ma ◽  
N Graves
Keyword(s):  
National Security ◽  
Hot Spots ◽  
Air Toxics ◽  
Emissions Inventory

Distribution of Daily Breathing Rates For Use in California's Air Toxics Hot Spots Program Risk Assessments

2002 ◽  
Vol 8 (7) ◽  
pp. 1723-1737 ◽  
Author(s):  
Melanie A. Marty ◽  
Robert J. Blaisdell ◽  
Rachel Broadwin ◽  
Martin Hill ◽  
Dorothy Shimer ◽  
...  
Keyword(s):  
Hot Spots ◽  
Risk Assessments ◽  
Air Toxics

scholarly journals Spatial Regulation of Air Toxics Hot Spots

2015 ◽  
Vol 34 (2) ◽  
pp. 298-327 ◽  
Author(s):  
Rama Mohana R. Turaga ◽  
Douglas Noonan ◽  
Ann Bostrom
Keyword(s):  
Hot Spots ◽  
Air Toxics ◽  
Spatial Regulation

A high-performance oil-free backing pump for electron microscopes

1978 ◽  
Vol 36 (1) ◽  
pp. 110-111
Author(s):  
G.K.W. Balkau ◽  
E. Bez ◽  
J.L. Farrant
Keyword(s):  
Molecular Weight ◽  
Electron Microscope ◽  
Hot Spots ◽  
High Performance ◽  
Carbonaceous Material ◽  
Contamination Rate ◽  
Low Molecular Weight ◽  
Principal Source ◽  
Rotary Pumps ◽  
Electron Microscopes

The earliest account of the contamination of electron microscope specimens by the deposition of carbonaceous material during electron irradiation was published in 1947 by Watson who was then working in Canada. It was soon established that this carbonaceous material is formed from organic vapours, and it is now recognized that the principal source is the oil-sealed rotary pumps which provide the backing vacuum. It has been shown that the organic vapours consist of low molecular weight fragments of oil molecules which have been degraded at hot spots produced by friction between the vanes and the surfaces on which they slide. As satisfactory oil-free pumps are unavailable, it is standard electron microscope practice to reduce the partial pressure of organic vapours in the microscope in the vicinity of the specimen by using liquid-nitrogen cooled anti-contamination devices. Traps of this type are sufficient to reduce the contamination rate to about 0.1 Å per min, which is tolerable for many investigations.

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