scholarly journals Non-Destructive Assay and Measurement Control for Domestic Nuclear Safeguards

2021 ◽  
Author(s):  
Wilder Greene
Keyword(s):  
Nuclear Safeguards ◽  
Measurement Control ◽  
Non Destructive

A Prototype of Tomographic Gamma Scanner

2017 ◽  
Author(s):  
Zhang Quanhu ◽  
Li Sufen ◽  
Hou Suxia ◽  
Zhang Lin ◽  
Zuo Wenming
Keyword(s):  
Cooling System ◽  
Arms Control ◽  
External Source ◽  
High Accuracy ◽  
Radioactive Material ◽  
Nuclear Safeguards ◽  
Nuclear Materials ◽  
Successful Implementation ◽  
Non Destructive ◽  
Gamma Scanning

Tomographic gamma scanning (TGS) method is one of the most advanced non-destructive assay (NDA) methods. TGS method can determine quantitatively with high accuracy transuranic nuclides in heterogeneously distributed media with medium- and high-density, and is thus widely used to assay the location and quantity of selected radioisotopes in scraps and wastes within sealed containers. In this paper, a prototype of tomographic gamma scanner which we designed is introduced. The TGS system is composed with four parts: external source with front collimator, radioactive material drum turning table, HPGe γ detector assembly including back collimator and cooling system, and computer. Successful implementation of the work has broken through the difficult problems or restraints to the development and applications of TGS, it will be applied widely to the non-destructive assay of nuclear materials within sealed container in the nuclear safeguards, radwaste measurement and arms control fields.

Luminescence from individual dislocations in II-VI and III-V semiconductors

1991 ◽  
Vol 49 ◽  
pp. 834-835
Author(s):  
J W Steeds
Keyword(s):  
Group Iv ◽  
Luminescence Properties ◽  
Carrier Recombination ◽  
Transmission Electron ◽  
Wide Range ◽  
Basic Physics ◽  
Semiconducting Compounds ◽  
Diamond Group ◽  
Non Destructive ◽  
Technological Significance

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.

Forensic Identifications Aided by Scanning Electron Microscopy of Silicone-Epoxy Microreplicas of Calcified and Cornified Structures

1975 ◽  
Vol 33 ◽  
pp. 678-679 ◽  
Author(s):  
R.F. Sognnaes
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Forensic Science ◽  
George Washington ◽  
Epithelial Surface ◽  
Extended Application ◽  
Tissue Surfaces ◽  
Non Destructive ◽  
Scanning Electron ◽  
Surface Changes

Sufficient experience has been gained during the past five years to suggest an extended application of microreplication and scanning electron microscopy to problems of forensic science. The author's research was originally initiated with a view to develop a non-destructive method for identification of materials that went into objects of art, notably ivory and ivories. This was followed by a very specific application to the identification and duplication of the kinds of materials from animal teeth and tusks which two centuries ago went into the fabrication of the ivory dentures of George Washington. Subsequently it became apparent that a similar method of microreplication and SEM examination offered promise for a whole series of problems pertinent to art, technology and science. Furthermore, what began primarily as an application to solid substances has turned out to be similarly applicable to soft tissue surfaces such as mucous membranes and skin, even in cases of acute, chronic and precancerous epithelial surface changes, and to post-mortem identification of specific structures pertinent to forensic science.

Non destructive testing of works of art by terahertz analysis

2013 ◽  
Vol 64 (2) ◽  
pp. 21001 ◽  
Author(s):  
Jean-Luc Bodnar ◽  
Jean-Jacques Metayer ◽  
Kamel Mouhoubi ◽  
Vincent Detalle
Keyword(s):  
Non Destructive Testing ◽  
Destructive Testing ◽  
Works Of Art ◽  
Non Destructive

Procédures, méthodes et résultats de la métallographie non-destructive

1984 ◽  
Vol 72 (8-9) ◽  
pp. 339-343
Author(s):  
René Hoeg ◽  
Lars Taarnskov
Keyword(s):  
Non Destructive

Analyse non destructive d’objets métalliques anciens

1953 ◽  
Vol 50 (2) ◽  
pp. 136-138 ◽  
Author(s):  
Georges Ambrosino ◽  
Pierre Pindrus
Keyword(s):  
Non Destructive
Sign in / Sign up

Export Citation Format

Share Document