scholarly journals Characterization of plutonium-bearing wastes by chemical analysis and analytical electron microscopy

1995 ◽  
Author(s):  
R.G. Behrens ◽  
E.C. Buck ◽  
N.L. Dietz ◽  
J.K. Bates ◽  
E. Van Deventer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Chemical Analysis ◽  
Analytical Electron Microscopy ◽  
Analytical Electron

scholarly journals Characterization of Magnetoliposomes by Analytical Electron Microscopy

2003 ◽  
Vol 9 (S02) ◽  
pp. 206-207
Author(s):  
Shu-You Li ◽  
Ying Guo ◽  
M. Aslam ◽  
Lei Fu ◽  
Vinayak P. Dravid
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Analytical Electron

Characterization of TiB2Ti(CN)Ni ceramics by transmission and analytical electron microscopy

1993 ◽  
Vol 16 (6) ◽  
pp. 317-321 ◽  
Author(s):  
J.Y. Dai ◽  
D.X. Li ◽  
H.Q. Ye ◽  
G.J. Zhang ◽  
Z.Z. Jin
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Analytical Electron

Characterization of Si(Li) x-ray detector efficiencies in the low energy range

1986 ◽  
Vol 44 ◽  
pp. 710-711
Author(s):  
G. Wirmark ◽  
G. Wahlberg ◽  
H. Nordén
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Energy Range ◽  
Analytical Electron Microscopy ◽  
Low Energy ◽  
Ratio Method ◽  
X Ray ◽  
Standard Specimens ◽  
Analytical Electron

X-ray microanalysis with windowless or ultra-thin window Si(Li)-detectors is becoming increasingly important in analytical electron microscopy. The most common approach in the quantification of this method is the thin film ratio method.where CA and CB denote the concentrations of elements A and B respectively and IA and IB are the corresponding x-ray intensities. The KAB-factor should ideally be determined from analyses of standard specimens of known compositions.

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