scholarly journals Cognitive Hybrid Radio Waveforms for High-Reliability Secure Wireless Communications, STL-013-19, Year 2

2020 ◽  
Author(s):  
Steven Koppenjan ◽  
Howard Wong
Keyword(s):  
Wireless Communications ◽  
High Reliability

Intelligent Monitoring Water System by PLC (Power Line Carrier) and Wireless Communication

2013 ◽  
Vol 846-847 ◽  
pp. 283-287
Author(s):  
Hong Mei Wang ◽  
Xu Ming Long ◽  
Ai Ling Luo
Keyword(s):  
Wireless Communications ◽  
Data Storage ◽  
High Reliability ◽  
Water System ◽  
Power Line ◽  
Core Network ◽  
Low Carbon ◽  
Single Chip ◽  
Power Line Carrier ◽  
Query Node

To saves water resources and low carbon environmental, we have designed a smart monitoring watering system based on power carrier and wireless communications, the system schema is divided into three layer, background server control the concentrated controller through wireless core network; each concentrated controller controls watering system through power carrier network; watering systems as the terminal access points of The Internet of Things , directly control the location regional's temperature, humidity and the soil situation, thereby achieved unmanned unattended, automatically watering. System integrates technology as wireless communications, power line carrier, single-chip microcomputer , application in LCD and so on, through hardware and software design, realizes data storage, the node information query, node failures and cable guard alarm function. Experimental results show that the overall system has low power consumption, high reliability, strong anti-jamming ability, so that it can better meet site's needs.

Remote Ride Quality Monitoring of Acela Train Set Performance

Joint Rail ◽  
2002 ◽  
Author(s):  
Patrick Ackroyd ◽  
Steven Angelo ◽  
Boris Nejikovsky ◽  
Jeffrey Stevens
Keyword(s):  
Wireless Communications ◽  
Remote Monitoring ◽  
High Speed ◽  
High Reliability ◽  
Real Life ◽  
Ride Quality ◽  
Monitoring Systems ◽  
Car Body ◽  
Central Processing ◽  
Remote Monitoring Systems

Federal Track Safety Standards require daily measurements of car body and truck accelerations on trains operating at speeds above 125-MPH. In compliance with this requirement, twelve high-speed Acela coaches, operating in the Northeast Corridor between Boston, MA, and Washington DC, have been equipped with remote monitoring systems. The systems provide continuous measurement of car body and truck motions, detect various acceleration events, tag them with GPS time and location information, and deliver the data to Central Processing Stations through wireless communications channels. The Central Processing Stations installed at the National Railroad Passenger Corporation (Amtrak) and ENSCO, Inc., headquarters provide email and pager notifications to designated Amtrak officers and also make the data available to them over secure Intranet and Internet connections. The overall architecture has multiple levels of protection and redundancy in order to ensure high reliability and availability of the service. The systems have been in continuous operation for over a year and provided a multitude of valuable information. Examples of system-reported acceleration events include events caused by track irregularities and train handling. The paper also describes some of the real-life operational scenarios and situations that arise when autonomous remote monitoring systems are used, including wireless communications coverage issues, GPS location pitfalls, and maintenance issues.

Failure Analysis With the Scanning Electron Microscope

1972 ◽  
Vol 30 ◽  
pp. 482-483
Author(s):  
John R. Devaney
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
High Reliability ◽  
Military Applications ◽  
Small Structure ◽  
Useful Life ◽  
Insight Into ◽  
Scanning Electron

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.

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