Cryocooler conduction-cooled SRF cavities for compact particle accelerators

An overview of fundamentals of superconductors under radio-frequency electromagnetic fields in particle accelerators is given, with emphasis on intrinsic physics and materials mechanisms which limit the performance of the superconducting radio-frequency (SRF) resonator cavities. Multiscale mechanisms which control the surface resistance and the quality factor of the SRF cavities at low and high rf fields are discussed. We also discuss possible ways of pushing the limit of the SRF performance by materials impurities and multilayer nanostructuring which may open up opportunities of using materials other than Nb to significantly increase the maximum accelerating fields and improve the performance of the SRF cavities operating at 4.2 K.

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Specimen Preparation of Near Surface Ion Irradiated Samples

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117820 ◽

1985 ◽

Vol 43 ◽

pp. 170-171

Author(s):

K. F. Russell ◽

L. L. Horton

Keyword(s):

Radiation Damage ◽

Heavy Ions ◽

Target Material ◽

Metal Alloys ◽

Specimen Surface ◽

Specimen Preparation ◽

Particle Accelerators ◽

Near Surface ◽

Graaff Accelerator ◽

Van De Graaff

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.

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