scholarly journals Structural Studies of Amorphous Materials by Fluctuation Electron Microscopy

2018 ◽  
Author(s):  
Michael M. J. Treacy ◽  
Keyword(s):  
Electron Microscopy ◽  
Amorphous Materials ◽  
Structural Studies ◽  
Fluctuation Electron Microscopy

Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy

2010 ◽  
Vol 110 (10) ◽  
pp. 1273-1278 ◽  
Author(s):  
Stephanie N. Bogle ◽  
Lakshmi N. Nittala ◽  
Ray D. Twesten ◽  
Paul M. Voyles ◽  
John R. Abelson
Keyword(s):  
Electron Microscopy ◽  
Amorphous Materials ◽  
Size Analysis ◽  
Variable Resolution ◽  
Fluctuation Electron Microscopy ◽  
Nanoscale Order

scholarly journals Fluctuation Electron Microscopy and Computational Structure Refinement for the Structure of Amorphous Materials

2016 ◽  
Vol 22 (S3) ◽  
pp. 486-487 ◽  
Author(s):  
Jason Maldonis ◽  
Pei Zhang ◽  
Li He ◽  
Ankit Gujral ◽  
Mark D. Ediger ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Amorphous Materials ◽  
Structure Refinement ◽  
Computational Structure ◽  
Fluctuation Electron Microscopy

Quantitative Fluctuation Electron Microscopy in the STEM: Methods to Identify, Avoid, and Correct for Artifacts

2014 ◽  
Vol 20 (5) ◽  
pp. 1605-1618 ◽  
Author(s):  
Tian T. Li ◽  
Stephanie N. Bogle ◽  
John R. Abelson
Keyword(s):  
Electron Microscopy ◽  
Amorphous Materials ◽  
Scanning Transmission Electron Microscope ◽  
Scattering Intensity ◽  
Convenient Means ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Fluctuation Electron Microscopy ◽  
High Level ◽  
Nanoscale Order

AbstractFluctuation electron microscopy can reveal the nanoscale order in amorphous materials via the statistical variance in the scattering intensity as a function of position, scattering vector, and resolution. However, several sources of experimental artifacts can seriously affect the magnitude of the variance peaks. The use of a scanning transmission electron microscope for data collection affords a convenient means to check whether artifacts are present. As nanodiffraction patterns are collected in serial, any spatial or temporal dependence of the scattering intensity across the series can easily be detected. We present examples of the major types of artifact and methods to correct the data or to avoid the problem experimentally. We also re-cast the statistical formalism used to identify sources of noise in view of the present results. The present work provides a basis on which to perform fluctuation electron microscopy with a high level of reliability and confidence in the quantitative magnitude of the data.

scholarly journals Reducing Decoherence in Fluctuation Electron Microscopy

2021 ◽  
Vol 27 (S1) ◽  
pp. 1776-1777
Author(s):  
Armin Zjajo ◽  
Itai Matzkevich ◽  
Hongchu Du ◽  
Rafal Dunin-Borkowski ◽  
Aram Rezikyan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Fluctuation Electron Microscopy

Structural studies on crystals found in the intestine of Nematodirus battus

1980 ◽  
Vol 208 (1173) ◽  
pp. 409-414
Keyword(s):  
Electron Microscopy ◽  
Unit Cell ◽  
Structural Studies ◽  
Cell Dimensions ◽  
Unit Cell Dimensions

Crystals found in the lumen of the intestine of Nematodirus battus have been studied by electron microscopy. Two of the unit cell dimensions are 16 nm x 23 nm. The possibility of an immunological significance for these crystals is considered.

Examination of a Polycrystalline Thin-Film Model to Explore the Relation between Probe Size and Structural Correlation Length in Fluctuation Electron Microscopy

2012 ◽  
Vol 18 (1) ◽  
pp. 241-253 ◽  
Author(s):  
M.M.J. Treacy ◽  
J.M. Gibson
Keyword(s):  
Electron Microscopy ◽  
Random Network ◽  
Voronoi Tessellation ◽  
Coherent Scattering ◽  
Specimen Thickness ◽  
Probe Size ◽  
Thin Film Model ◽  
Mean Grain Size ◽  
Fluctuation Electron Microscopy ◽  
Thin Polycrystalline

AbstractWe examine simulated electron microdiffraction patterns from models of thin polycrystalline silicon. The models are made by a Voronoi tessellation of random points in a box. The Voronoi domains are randomly selected to contain either a randomly-oriented cubic crystalline grain or a region of continuous random network material. The microdiffraction simulations from coherent probes of different widths are computed at the ideal kinematical limit, ignoring inelastic and multiple scattering. By examining the normalized intensity variance that is obtained in fluctuation electron microscopy experiments, we confirm that intensity fluctuations increase monotonically with the percentage of crystalline grains in the material. However, anomalously high variance is observed for models that have 100% crystalline grains with no imperfections. We confirm that the reduced normalized variance, V(k,R) − 1, that is associated with four-body correlations at scattering vector k, varies inversely with specimen thickness. Further, for probe sizes R larger than the mean grain size, we confirm that the reduced normalized variance obeys the predicted form given by Gibson et al. [Ultramicroscopy, 83, 169–178 (2000)] for the kinematical coherent scattering limit.

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