A Study of Inclusive Kaon Charge Exchange in the Triple Regge Region

Inclusive Kaon Charge Exchange in the Triple-Regge Region at High Energies

Physical Review Letters ◽

10.1103/physrevlett.46.1358 ◽

1981 ◽

Vol 46 (21) ◽

pp. 1358-1361 ◽

Cited By ~ 3

Author(s):

P. M. Yager ◽

H. G. E. Kobrak ◽

R. E. Pitt ◽

R. A. Swanson ◽

K. W. Edwards ◽

...

Keyword(s):

Charge Exchange ◽

High Energies ◽

Regge Region

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An SU(3)-based comparison between inclusive kaon and pion charge exchange scattering in the triple Regge region

Nuclear Physics B ◽

10.1016/0550-3213(82)90528-4 ◽

1982 ◽

Vol 206 (2) ◽

pp. 173-184 ◽

Cited By ~ 2

Author(s):

A.V. Barnes ◽

G.C. Fox ◽

R.G. Kennett ◽

R.L. Walker ◽

P.M. Yager ◽

...

Keyword(s):

Charge Exchange ◽

Regge Region ◽

Exchange Scattering

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Regge cuts and charge-exchange reactions in the triple-Regge region

Physical Review D ◽

10.1103/physrevd.13.3015 ◽

1976 ◽

Vol 13 (11) ◽

pp. 3015-3020 ◽

Cited By ~ 7

Author(s):

Frank E. Paige ◽

D. P. Sidhu

Keyword(s):

Charge Exchange ◽

Exchange Reactions ◽

Regge Region

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First H+ Charge-Exchange Images in the Stim.

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092487 ◽

1976 ◽

Vol 34 ◽

pp. 504-505

Author(s):

Wm. H. Escovitz ◽

T. R. Fox ◽

R. Levi-Setti

Keyword(s):

Charge Exchange ◽

Neutral Component ◽

Channel Electron Multiplier ◽

Electron Multiplier ◽

Neutral Particles ◽

Charged Beam ◽

Scanning Transmission ◽

Contrast Mechanism ◽

Ion Microscopy ◽

Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

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